Cadence CADENCE QUICKVIEW LAYOUT AND MANUFACTURING DATA VIEWER Datasheet - page 2
© 2008 Cadence design Systems, inc. all rights reserved. Cadence is a trademark and the Cadence logo is a registered trademark of
Cadence design Systems, inc. all others are properties of their respective holders.
20597/4806 07/08 Mk/MVC/CS/PdF
BeneFiTS
• Multi-format display capabilities enable
the viewing and superimposing of
design data in any of its intermediate
conditions throughout the design-
finishing process
• Offers high-performance, high-capacity
data viewing with powerful options
that allow the full range of display,
from deep sub-micron features to full
reticle or mask-level databases
• Intelligent overlay and graphical XOR
capabilities make graphical comparisons
of data easy by providing an additional
element of decision support
• Enables graphical verification of reticle
designs based on the actual data used in
mask manufacturing, which eliminates
expensive jobdeck errors and improves
the predictability of cycle times
• Enables coordinate scaling, off-setting,
rotation, and/or mirroring for overlaying
and comparing multiple datasets
• Enables fast and powerful measurement
and analysis
• Crosstalk communications feature
enables graphical communication
among multiple sites with remote
pan, zoom, measure, and screen mark
up, minimizing the need for plotting
and printing
• Offers efficient and generic means of
displaying and stepping through DrC
error diagnostics results
• Displays bitmap images, enabling direct
graphical comparison with any other
supported format
• Accepts industry-standard formats
• Offers a configurable GUI
• Includes a full-featured macro language
for the development of custom viewing
and data inspection applications
FeaTuReS
ViewinG LaYOuT FORMaTS
• Supports multiple layout formats:
– gDSII
– oASIS
– openAccess
– LAff
– gL/1
• May be viewed concurrently to verify
changes, alignment, or interaction with-
out the worry of cell name collisions
• May be viewed mirrored, rotated,
scaled, and offset
• Various data query functions are avail-
able including hierarchical listings,
reference and geometry status com-
mands, and a cell finder
• A general purpose stepper automatically
pans and zooms to cell instances, as well
as geometric properties and attributes
ViewinG ManuFaCTuRinG
FORMaTS and JOBdeCkS
• Supports leading manufacturing formats:
– MEBES through Mode 5 (data, job-
decks, SemiP10)
– JEoL 2.1, 3.0, and 3.1 (data and job-
decks)
– Toshiba VSB 11and 12 (data and job-
decks)
– HL800, HL900, and HL950 (data)
• May be viewed concurrently to verify
changes, alignment, or interaction
• May be viewed mirrored, rotated,
scaled, and offset
• May be viewed in normal or reverse tone
• Stripe and segment boundaries, as well
as virtual addressing, may be superim-
posed on the pattern data
• Pattern statistics are made available
using the QuickView “identify” and
“analyze” commands
• Rapid display of complete mask or
reticle data in fractured format using
manufacturing-ready jobdecks and
appropriate data files
• Useful statistical information may be
extracted and displayed
CadenCe SeRViCeS and
SuPPORT
• Cadence application engineers can
answer your technical questions by
telephone, email, or internet — they
can also provide technical assistance
and custom training
• SourceLink
®
online customer support
gives you answers to your technical
questions — 24 hours a day, 7 days a
week — including the latest in quarterly
software rollups, product release infor-
mation, technical documentation, soft-
ware updates, and more
• Cadence-certified instructors teach more
than 80 courses and bring their real-
world experience into the classroom
• More than 25 Internet Learning Series
(iLS) online courses allow you the flex-
ibility of training at your own computer
via the Internet
For more information,
log on to:
www.cadence.com
or email:
k2_support@cadence.com