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JDS Uniphase CT-650 Reference Manual

Manual is about: Wideband Test Unit Command-Line Reference Guide

Summary of CT-650

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    Ct-650 wideband test unit release 9.4 command-line reference guide.

  • Page 3: Ct-650 Wideband Test Unit

    Ct-650 wideband test unit release 9.4 command-line reference guide.

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    Ct-650 command-line reference guide release 9.4 v notice every effort was made to ensure that the information in this document was accurate at the time of printing. However, information is subject to change without notice, and jdsu reserves the right to provide an addendum to this document with info...

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    Vi ct-650 command-line reference guide release 9.4 the following table defines safety terms. Failure to observe these precautions while using the ct-650, violates the intended use of this product. When using this product, always follow basic safety precautions to reduce the risk of fire, shock, and ...

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    Ct-650 command-line reference guide release 9.4 vii symbols the following safety symbols are used on the ct-650. All safety precautions must be observed when operating, servicing, or repairing the ct-650. Failure to comply with the following safety precautions or with hazard cautions and warnings us...

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    Viii ct-650 command-line reference guide release 9.4 compliance information the ct-650s complies with the following standards: federal communications commission (fcc) notice this product was tested and found to comply with the limits for a class a digital device, pursuant to part 15 of the fcc rules...

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    Ct-650 command-line reference guide release 9.4 ix contents about this guide xxiii purpose and scope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Xxiv assumptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Xxiv related information . ....

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    Contents x ct-650 command-line reference guide release 9.4 sample test procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 step 1: initiate the test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 step 2: split the circuit. . . . . . . . . . . . . . . ....

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    Contents ct-650 command-line reference guide release 9.4 xi help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 syntax . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 remarks . . . . . . . . . . . . . . . . . . . . . . ...

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    Contents xii ct-650 command-line reference guide release 9.4 screen_refresh . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 syntax. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 self_test . . . . . . . . . . . . . . . . . . . . . . . . ...

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    Contents ct-650 command-line reference guide release 9.4 xiii report . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 syntax . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 remark. . . . . . . . . . . . . . . . . . . . . . ...

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    Contents xiv ct-650 command-line reference guide release 9.4 ds1_di_split. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 syntax. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 remark . . . . . . . . . . . . . . . . . . . . . . . . ...

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    Contents ct-650 command-line reference guide release 9.4 xv ft1_di_split . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54 syntax . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54 remark. . . . . . . . . . . . . . . . . . . . . . . . . ...

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    Contents xvi ct-650 command-line reference guide release 9.4 mju. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62 syntax. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62 remarks . . . . . . . . . . . . . . . . . . . . . ...

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    Contents ct-650 command-line reference guide release 9.4 xvii tlhangup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 syntax . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 remark. . . . . . . . . . . . . . . . . . . . . . . . ...

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    Contents xviii ct-650 command-line reference guide release 9.4 configure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86 adding and modifying configurations . . . . . . . . . . . . . . . . . 86 deleting configurations . . . . . . . . . . . . . . . . . . . . . . ...

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    Contents ct-650 command-line reference guide release 9.4 xix system_test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102 syntax . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102 example . . . . . . . . . . . . . . . . . . . . . . . . . ...

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    Contents xx ct-650 command-line reference guide release 9.4 signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 144 time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 144 ft1 results. . . . . . . . . . . . . . . . . ....

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    Contents ct-650 command-line reference guide release 9.4 xxi appendix d customer services and support 209 about our services . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 210 standard support services. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 210 instrume...

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    Contents xxii ct-650 command-line reference guide release 9.4.

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    Ct-650 command-line reference guide release 9.4 xxiii about this guide – “purpose and scope” on page xxiv – “assumptions” on page xxiv – “related information” on page xxiv – “conventions” on page xxiv.

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    About this guide purpose and scope xxiv ct-650 command-line reference guide release 9.4 purpose and scope the purpose of this guide is to help you successfully use the features and capabilities of the ct-650 as part of your network service fulfill- ment and assurance solution. This reference guide c...

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    About this guide conventions ct-650 command-line reference guide release 9.4 xxv code and output messages appear in this typeface . All results okay text you must enter exactly as shown appears in this typeface . Type: a:\set.Exe in the dialog box variables appear in this typeface . Type the new hos...

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    About this guide conventions xxvi ct-650 command-line reference guide release 9.4 keyboard and menu conventions description example a plus sign + indicates simulta- neous keystrokes. Press ctrl+s a comma indicates consecutive key strokes. Press alt+f,s a slanted bracket indicates choos- ing a submen...

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    1 ct-650 command-line reference guide release 9.4 1 chapter 1 getting started this chapter presents basic information on operating the ct-650 using the command-line interface. Topics discussed in this chapter are as follows: – “about the new uspii processor module” on page 2 – “about the new rtu car...

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    Chapter 1 getting started about the new uspii processor module 2 ct-650 command-line reference guide release 9.4 about the new uspii processor module a new uspii main processor module has been developed to replace the processor module previously used in the ct-650 and ct-650s products. It has been d...

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    Chapter 1 getting started about the new rtu cards ct-650 command-line reference guide release 9.4 3 – dt1-r2 – dtu-r2 – dt3-r2 the new cards are compatible with the old cards, therefore these new rtus can be installed in a system with old rtu cards. This allows the flexibility to mix old and new rtu...

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    Chapter 1 getting started about the new rtu cards 4 ct-650 command-line reference guide release 9.4 figure 1 shows the difference in led configuration on the front panel of the r2 rtus for ct-650 versus that of the old rtus. Table 2 part numbers and clei codes for the old and new rtu cards old rtu c...

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    Chapter 1 getting started logging on ct-650 command-line reference guide release 9.4 5 figure 2 shows the difference in led configuration on the front panel of the r2 rtus for ct-650s versus that of the old rtus. Logging on to start a session with the ct-650, you need to log on with a user name and ...

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    Chapter 1 getting started understanding the ct-650 screens 6 ct-650 command-line reference guide release 9.4 for an explanation of this screen, refer to “understanding the ct-650 screens” on page 6 . Understanding the ct-650 screens the ct-650 displays different types of screens for displaying menus...

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    Chapter 1 getting started understanding the ct-650 screens ct-650 command-line reference guide release 9.4 7 – auxiliary commands appear in the bottom portion of the screen. The available auxiliary commands change depending on the type of test you are performing, as well as the features installed on...

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    Chapter 1 getting started understanding the ct-650 screens 8 ct-650 command-line reference guide release 9.4 command screens a command screen displays the available parameter values for a command. For example, in figure 5 , the command screen lists the values 3ecs3 , 6ecs3 , and 7ecs3 , which are va...

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    Chapter 1 getting started understanding the ct-650 screens ct-650 command-line reference guide release 9.4 9 results screens the ct-650 displays test results in a results screen (see figure 7 ). The following sections appear in a results screen: – a header, which displays system information and gene...

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    Chapter 1 getting started understanding the ct-650 screens 10 ct-650 command-line reference guide release 9.4 loopback status line the loopback status line appears after starting a loopback test ( figure 8 ). For definitions of the fields appearing in the loopback status line, see page 170 . Figure ...

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    Chapter 1 getting started entering commands ct-650 command-line reference guide release 9.4 11 information screens information screens, such as the one in figure 9 , display a variety of system and test information. You can open the information screens with the information command, which is describe...

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    Chapter 1 getting started entering commands 12 ct-650 command-line reference guide release 9.4 editing commands if you need to make changes to a command, press backspace or delete (depending on your terminal). You can also retype and edit previous commands by using the history command; see page 37 f...

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    Chapter 1 getting started sample test procedure ct-650 command-line reference guide release 9.4 13 depending on the installed options, additional hotkeys are available. Sample test procedure a typical test scenario requires the following steps: 1 initiate a test by issuing a monitor command. 2 split...

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    Chapter 1 getting started sample test procedure 14 ct-650 command-line reference guide release 9.4 step 1: initiate the test 1 from the main menu, type ds3 . The ds3 menu appears. 2 type monitor and press space . The first command screen appears, listing the names of available 3/3 dcs devices. *** c...

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    Chapter 1 getting started sample test procedure ct-650 command-line reference guide release 9.4 15 3 type the name of your 3/3 device and press space . The next command screen prompts for the digroup. 4 type an appropriate digroup number and press space . The next command screen asks for a test name...

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    Chapter 1 getting started sample test procedure 16 ct-650 command-line reference guide release 9.4 5 type a name for the test and press space . The next screen prompts for a log file name. 6 type a name for the log file, and then press space . The next screen prompts for the framing mode. *** ct14 *...

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    Chapter 1 getting started sample test procedure ct-650 command-line reference guide release 9.4 17 7 type auto and press space to use automatic framing. The next screen prompts for the test’s duration. 8 type 24-30-00 and press space . The next screen prompts you to press enter , indicating the comm...

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    Chapter 1 getting started sample test procedure 18 ct-650 command-line reference guide release 9.4 9 press enter . The confirmation screen lists the parameters entered, and prompts for a confirmation to proceed with the test 10 type your confirmation by pressing y and enter . The ct-650 runs the tes...

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    Chapter 1 getting started sample test procedure ct-650 command-line reference guide release 9.4 19 12 to display the ds3 monitor menu, press q . The ds3 monitor menu appears. The test continues to run. Step 2: split the circuit at the ds3_mon> prompt, type the command ds3_split . This splits the cir...

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    Chapter 1 getting started logging off 20 ct-650 command-line reference guide release 9.4 step 6: disconnect the test at the ds3_tst> prompt, type the command disconnect release_test no . This disconnects the test from the circuit. Logging off be sure to log off the ct-650 when you are not performing...

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    2 ct-650 command-line reference guide release 9.4 21 chapter 2 auxiliary and common commands there are many commands that do not pertain directly to testing. Auxiliary commands provide information on the test environment, as well as access to the operating system and connected dcs units. Common comm...

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    Chapter 2 auxiliary and common commands auxiliary commands 22 ct-650 command-line reference guide release 9.4 auxiliary commands this section describes the auxiliary commands. Batch_command executes a batch file. You can use a batch file to automate testing or other repetitive processes. Syntax batc...

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    Chapter 2 auxiliary and common commands auxiliary commands ct-650 command-line reference guide release 9.4 23 example the following commands allocate the rtu in shelf 1, slot 10, side a, to the subsequent monitor test. Choose rtu 1_10a monitor ct14 11 1 mytest mylog auto continuous daytime displays ...

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    Chapter 2 auxiliary and common commands auxiliary commands 24 ct-650 command-line reference guide release 9.4 remarks – if you do not specify a log_file , the ct-650 deletes all the log files created under your account id. – if you want to delete a log file associated with an active test, first term...

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    Chapter 2 auxiliary and common commands auxiliary commands ct-650 command-line reference guide release 9.4 25 remarks – you can specify an error rate from 1e-2 to 1e-9. – you can view the default error rate by typing the command information configure defaults circuit_type > . – this command is avail...

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    Chapter 2 auxiliary and common commands auxiliary commands 26 ct-650 command-line reference guide release 9.4 – the batch files for the user account are found in the /ttc/ user_name > directory. Log files are listed under the /ttc/ user_name >/log directory. Help displays information on a command. S...

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    Chapter 2 auxiliary and common commands auxiliary commands ct-650 command-line reference guide release 9.4 27 information configure rtu rtu_type > displays the configuration for the rtu_type . Information configure defaults test_type > displays default parameter values for the specified test_type . ...

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    Chapter 2 auxiliary and common commands auxiliary commands 30 ct-650 command-line reference guide release 9.4 – the parameters num_repeaters and channel are required depending on the type of circuit and loop code. – the last two forms of the command are for ds3 tests. – after executing a loop up or ...

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    Chapter 2 auxiliary and common commands auxiliary commands ct-650 command-line reference guide release 9.4 31 port_connect establishes a link between any unconfigured tty communications port and your current tty communications port. This command enables communication with a remote test device, such ...

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    Chapter 2 auxiliary and common commands auxiliary commands 32 ct-650 command-line reference guide release 9.4 example the following command defines a loop-up code of 1001 and a loop- down code of 1000. Prog_loop 1001 1000 record starts or stops recording commands to a log file. Syntax record on file...

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    Chapter 2 auxiliary and common commands auxiliary commands 34 ct-650 command-line reference guide release 9.4 – when you issue this command, the ct-650 aborts any tests started with the monitor or measure commands. After the self- test completes, you can select the aborted test with the select_test ...

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    Chapter 2 auxiliary and common commands auxiliary commands ct-650 command-line reference guide release 9.4 35 remarks – the fad_type parameter is available only for dcss configured for single or dual fad testing. – release the loopback with the disconnect command. – some dcss require a port to be pr...

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    Chapter 2 auxiliary and common commands auxiliary commands 36 ct-650 command-line reference guide release 9.4 – to display the default user-programmable test patterns for different circuits, use the command information configure default . Example define a user1 test pattern equal to 2 8 -1. User_pat...

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    Chapter 2 auxiliary and common commands common test commands ct-650 command-line reference guide release 9.4 37 remarks – the message appears on the target user’s prompt line. – a message is transmitted each time you press enter . – to end the session, press ctrl+n . – you can also send messages usi...

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    Chapter 2 auxiliary and common commands common test commands 38 ct-650 command-line reference guide release 9.4 – after execution, the connected rtu remains allocated and the dcs connection remains unchanged. – you can view the test results accumulated until issuing the abort command. The results ar...

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    Chapter 2 auxiliary and common commands common test commands ct-650 command-line reference guide release 9.4 39 example the following procedure disconnects all tests that are currently running: 1 at the command prompt, type disconnect all . 2 type y to confirm disconnect report displays results of a...

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    Chapter 2 auxiliary and common commands common test commands 40 ct-650 command-line reference guide release 9.4.

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    3 ct-650 command-line reference guide release 9.4 41 chapter 3 ds3 test commands this chapter describes the commands available for testing ds3 circuits. These commands are available if you configured a 3/3 or 3/1 dcs to the ct-650. The definitions for command parameters appear in appendix b starting...

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    Chapter 3 ds3 test commands description of ds3 test commands 42 ct-650 command-line reference guide release 9.4 description of ds3 test commands this section describes the ds3 test commands. Ds3_measure runs an intrusive test. Syntax ds3_measure digroup_side > muxed ds1_framing_format > test_pattern...

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    Chapter 3 ds3 test commands description of ds3 test commands ct-650 command-line reference guide release 9.4 43 example the following command monitors a dual-fad 3/3 dcs and perform an ef split. Ds3_split ef_split idle_code feac_alarm selects the feac alarm to be transmitted in c-bit or multiplexed ...

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    Chapter 3 ds3 test commands description of ds3 test commands 44 ct-650 command-line reference guide release 9.4 – allocation of rtus is performed as follows: – if requesting a dual-fad connection, the ct-650 allocates both dt3 test card rtus to the dcs. – if requesting a single-fad connection is req...

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    4 ct-650 command-line reference guide release 9.4 45 chapter 4 ds1 test commands this chapter describes the commands available for testing ds1 circuits. These commands are available if you configured a 3/1 or 1/0 dcs fad connection. The definitions for command parameters appear in appendix b startin...

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    Chapter 4 ds1 test commands description of ds1 test commands 46 ct-650 command-line reference guide release 9.4 description of ds1 test commands this section describes the ds1 test commands. Di_monitor starts an intrusive drop and insert test. Syntax di_monitor system_name > digroup_number > channel...

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    Chapter 4 ds1 test commands description of ds1 test commands ct-650 command-line reference guide release 9.4 47 example the following command starts a continuous test on the connected side of a ds1 line with a 2 23 -1 pseudorandom test pattern. Ds1_di_measure connected prbs 2^23-1 continuous ds1_di_...

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    Chapter 4 ds1 test commands description of ds1 test commands 48 ct-650 command-line reference guide release 9.4 check_ pre-existing_loop detects a pre-existing loop in a t1 circuit. Syntax check_pre-existing_loop remark this command is available only after executing a ds1_split command. Example chec...

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    Chapter 4 ds1 test commands description of ds1 test commands ct-650 command-line reference guide release 9.4 49 example the following command enables logging of test results for bit error seconds and frame error seconds, but not severely errored seconds. Log_errors y n y n remarks – use the examine_...

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    Chapter 4 ds1 test commands considerations for slc-96 testing 50 ct-650 command-line reference guide release 9.4 example the following command initiates a ds1 monitor on the 3ecs1 dcs, digroup number 111. The test name is test234, and the log file name is maint1 . The test uses automatic framing and...

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    Chapter 4 ds1 test commands considerations for slc-96 testing ct-650 command-line reference guide release 9.4 51 – ds0 testing of slc-96 circuits is accomplished using either esf or d4 tad framing. – ds0 drop and insert vf or dds is supported on slc-96 circuits. – slc-96 datalink is not supported. –...

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    Chapter 4 ds1 test commands considerations for slc-96 testing 52 ct-650 command-line reference guide release 9.4.

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    5 ct-650 command-line reference guide release 9.4 53 chapter 5 ft1 test commands this chapter describes the commands available for testing ft1 circuits. These commands are available if you configured a 1/0 dcs connection. The definitions for command parameters appear in appendix b starting on page 1...

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    Chapter 5 ft1 test commands description of ft1 test commands 54 ct-650 command-line reference guide release 9.4 description of ft1 test commands this section describes the ft1 commands. Di_monitor starts a new test to monitor and drop ft1 channels. Syntax di_monitor system_name > digroup_side > chan...

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    Chapter 5 ft1 test commands description of ft1 test commands ct-650 command-line reference guide release 9.4 55 ft1_measure executes an intrusive test on the chosen side of the ft1 fad being tested. Syntax ft1_measure digroup_side > test_pattern_type > test_pattern > test_duration > remarks – this c...

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    Chapter 5 ft1 test commands description of ft1 test commands 56 ct-650 command-line reference guide release 9.4 monitor starts a monitor test. Syntax monitor system_name > digroup_side > channel > channel_type > test_name > log_file > test_duration > remark the default framing format configured for ...

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    Chapter 5 ft1 test commands description of ft1 test commands ct-650 command-line reference guide release 9.4 57 – the serial communications link between the ct-650 and dcs must have administrative or supervisor rights given to the link to allow degrooming and grooming of the digroup being tested. – ...

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    Chapter 5 ft1 test commands description of ft1 test commands 58 ct-650 command-line reference guide release 9.4.

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    6 ct-650 command-line reference guide release 9.4 59 chapter 6 ds0 dds test commands this chapter describes the commands available for testing ds0 dds circuits. These commands are available if you configured a 1/0 dcs with a tad connection. The definitions for command parameters appear in appendix b...

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    Chapter 6 ds0 dds test commands description of dds test commands 60 ct-650 command-line reference guide release 9.4 description of dds test commands this section describes the ds0 dds commands. Dds_di_measure executes an intrusive drop and insert test on the chosen side of the circuit under test. Sy...

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    Chapter 6 ds0 dds test commands description of dds test commands ct-650 command-line reference guide release 9.4 61 remarks – this command is available only after executing a dds_split command. – not all test_pattern_types require a test_pattern param- eter. Dds_split establishes an intrusive connec...

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    Chapter 6 ds0 dds test commands description of dds test commands 62 ct-650 command-line reference guide release 9.4 mju temporarily blocks, releases, or selects an mju branch. Syntax mju digroup_side > mju> mju_branch > remarks – this command is available only after executing a dds_di_measure comman...

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    Chapter 6 ds0 dds test commands description of dds test commands ct-650 command-line reference guide release 9.4 63 mju selected select_branch 1 monitor starts a new monitor test on a dds circuit. Syntax monitor system_name > channelization_mode > digroup_number > channel > channel_type > ds0a_subra...

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    Chapter 6 ds0 dds test commands description of dds test commands 64 ct-650 command-line reference guide release 9.4 log_errors starts the logging of errors detected during a test. Syntax log_errors log_bit_error_sec > log_sev_bit_error_sec > example the following command enables logging of test resu...

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    7 ct-650 command-line reference guide release 9.4 65 chapter 7 ds0 vf test commands this chapter describes the commands available for testing ds0 vf circuits. These commands are available if you configured a 1/0 dcs tad connection. The definitions for command parameters appear in appendix b starting...

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    Chapter 7 ds0 vf test commands trunk types and seizure sequences 66 ct-650 command-line reference guide release 9.4 trunk types and seizure sequences traffic on vf circuits starts with a seizure, which is an attempt to request an individual circuit. When a telephone goes off-hook, it actu- ally send...

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    Chapter 7 ds0 vf test commands description of vf test commands ct-650 command-line reference guide release 9.4 67 remarks – this command is available only after executing a vf_di_split command. – this command is available only if your ct-650 supports the enhanced signaling feature. – for a discussio...

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    Chapter 7 ds0 vf test commands description of vf test commands 68 ct-650 command-line reference guide release 9.4 remarks – this command is available if the signaling/vf option is installed. – for a discussion of seizure types, see page 66 . Hangup releases a connection established with the dial_out...

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    Chapter 7 ds0 vf test commands description of vf test commands 70 ct-650 command-line reference guide release 9.4 talk/listen instructs the rtu to route an incoming signal from a phone to the circuit under test. Syntax talk/listen digroup_side > remarks – use this command to communicate with a perso...

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    Chapter 7 ds0 vf test commands description of vf test commands ct-650 command-line reference guide release 9.4 71 tlstatus displays a screen showing the current status of a listen or talk/ listen session. Syntax tlstatus test_name > this syntax is available to all users. Tlstatus user_name > test_na...

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    Chapter 7 ds0 vf test commands description of vf test commands 72 ct-650 command-line reference guide release 9.4 3 khz notch noise 3k_notch measures noise with a 1004 hz holding tone (typically at -16 dbm, assuming a 0 db tlp) applied at the circuit's originating point. This test provides a measure...

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    Chapter 7 ds0 vf test commands description of vf test commands ct-650 command-line reference guide release 9.4 73 disable echo can- celler disable_ec disables the echo canceller feature of the hard- ware by transmitting the echo canceller tone before every vf test. This will ensure that echo cancell...

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    Chapter 7 ds0 vf test commands description of vf test commands 74 ct-650 command-line reference guide release 9.4 intermodu- lation distor- tion intermod_dist tx_level > measures the second and third harmonics of a test signal. To measure the harmonics, the ct-650 uses a test tone that comprises fou...

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    Chapter 7 ds0 vf test commands description of vf test commands ct-650 command-line reference guide release 9.4 75 peak-to- average ratio (p/ar) par tx_level > measures the p/ar rating of a channel. During this test, the ct-650 transmits a complex pulse train with known peak-to-average ratio. Distor-...

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    Chapter 7 ds0 vf test commands description of vf test commands 76 ct-650 command-line reference guide release 9.4 remarks – this command is available only after executing a vf_di_split command. – to perform an end-to-end test, execute the vf_di_measure command to transmit a test signal from the unit...

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    Chapter 7 ds0 vf test commands description of vf test commands ct-650 command-line reference guide release 9.4 77 remarks – this command is available only after executing a di_monitor command. – this command establishes an ab split across the ds1 signal with the selected ds0 channel configured in an...

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    Chapter 7 ds0 vf test commands description of vf test commands 78 ct-650 command-line reference guide release 9.4.

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    8 ct-650 command-line reference guide release 9.4 79 chapter 8 batch files if you perform a test repeatedly, you can automate the testing proce- dure using a batch file. A batch file contains a series of ct-650 commands and instructions that you group together. You can execute the commands in the ba...

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    Chapter 8 batch files creating and running batch files 80 ct-650 command-line reference guide release 9.4 creating and running batch files this section describes how to create and run batch files. To create a batch file 1 run the unix vi editor, and edit a new file. 2 type commands as you would at a...

  • Page 107

    Chapter 8 batch files unavailable commands for batch files ct-650 command-line reference guide release 9.4 81 unavailable commands for batch files table 6 lists the commands you cannot use in batch files. Ds0 monitor ds1 os_command ds1_measure printer ds1_split prog_loop ds3 release ds3_measure repo...

  • Page 108

    Chapter 8 batch files unavailable commands for batch files 82 ct-650 command-line reference guide release 9.4.

  • Page 109

    9 ct-650 command-line reference guide release 9.4 83 chapter 9 supervisor commands this chapter describes the commands available from the supervisor menu. Supervisors use these commands to configure the ct-650, manage user accounts, and to backup and restore system files. The definitions for command...

  • Page 110

    Chapter 9 supervisor commands descriptions of supervisory commands 84 ct-650 command-line reference guide release 9.4 descriptions of supervisory commands this section describes the supervisory commands. Accounts creates, deletes, and sets security levels for ct-650 accounts. For detailed informatio...

  • Page 111

    Chapter 9 supervisor commands descriptions of supervisory commands ct-650 command-line reference guide release 9.4 85 accounts security_account remove_cat_frm_user user_name > category_name > removes a category of commands from the specified user. Backup_files saves account information files, config...

  • Page 112

    Chapter 9 supervisor commands descriptions of supervisory commands 86 ct-650 command-line reference guide release 9.4 backup_files file target_file > file_name > backs up the target file into the specified file_name . Configure displays and modifies the system configuration and default values. Addin...

  • Page 113

    Chapter 9 supervisor commands descriptions of supervisory commands ct-650 command-line reference guide release 9.4 87 2 do one of the following: – to add a new configuration, type the id number displayed at the bottom of the screen. – to modify a configuration, scroll to the device by pressing the c...

  • Page 114

    Chapter 9 supervisor commands descriptions of supervisory commands 88 ct-650 command-line reference guide release 9.4 deleting configurations use the following procedure to delete a configuration. To delete a configuration 1 open the screen for the device whose configuration you want to delete. 2 mo...

  • Page 115

    Chapter 9 supervisor commands descriptions of supervisory commands ct-650 command-line reference guide release 9.4 89 configure dcs configure dcs configures the interfaces between the ct-650 and the dcs. You can change the following parameters: parameter description dcs number number identifying the...

  • Page 116

    Chapter 9 supervisor commands descriptions of supervisory commands 90 ct-650 command-line reference guide release 9.4 configuring rtus configure rtu displays the rtu configuration screen. Using these screens, you define default values for parameters required to test circuits. The appearance of the r...

  • Page 117

    Chapter 9 supervisor commands descriptions of supervisory commands ct-650 command-line reference guide release 9.4 91 system name name of dcs associated with the rtu. N/a appears if the rtu is not con- figured for a dcs. Dcs tp number the dcs test port number connected to the rtu. If the rtu is not ...

  • Page 118

    Chapter 9 supervisor commands descriptions of supervisory commands 92 ct-650 command-line reference guide release 9.4 configuring dt1 rtus the following parameters appear in the rtu configuration screen for dt1 test cards: parameter description shelf number always 1. Slot number slot location within...

  • Page 119

    Chapter 9 supervisor commands descriptions of supervisory commands ct-650 command-line reference guide release 9.4 93 configuring dtu rtus the following parameters appear in the rtu configuration screen for dtu test cards: idle condition pattern transmitted when the rtu is not in use. Possible value...

  • Page 120

    Chapter 9 supervisor commands descriptions of supervisory commands 94 ct-650 command-line reference guide release 9.4 signal source signal source for the tested circuit. Possible values are as follows: – int or internal indicates the signal comes from the backplane from another card. – ext or extern...

  • Page 121

    Chapter 9 supervisor commands descriptions of supervisory commands ct-650 command-line reference guide release 9.4 95 configuring sts-1 rtus the following parameters appear in the rtu configuration screen for sts-1 test cards: rx level receive signal level: brg (bridge), trm (terminate), or dsx (dsx...

  • Page 122

    Chapter 9 supervisor commands descriptions of supervisory commands 96 ct-650 command-line reference guide release 9.4 configure defaults configure defaults {ds3 ds1/ft1 ds0} configures default parameter values for the specified circuit (ds3, ds1, ft1 or ds0). For definitions of the fields in these s...

  • Page 123

    Chapter 9 supervisor commands descriptions of supervisory commands ct-650 command-line reference guide release 9.4 97 remarks: – you can use this screen to configure the node associated with the multiple cisco 15454 adm (hub). – a hub must be configured before making changes to this screen. Configur...

  • Page 124

    Chapter 9 supervisor commands descriptions of supervisory commands 98 ct-650 command-line reference guide release 9.4 configure answer_seq configure answer_seq configures the following parameters for a user-defined answer sequence. Configure dial_seq configure dial_seq configures the following param...

  • Page 125

    Chapter 9 supervisor commands descriptions of supervisory commands ct-650 command-line reference guide release 9.4 99 release releases one or all tests belonging to a specified user. Syntax release user_name > test_name > example the following command releases test345 from the user super . Release s...

  • Page 126

    Chapter 9 supervisor commands auxiliary supervisor commands 100 ct-650 command-line reference guide release 9.4 auxiliary supervisor commands the following sections describe the auxiliary commands available to supervisors. Clear_alarm clears the history of rtu alarms, such as frame loss and blue ala...

  • Page 127

    Chapter 9 supervisor commands auxiliary supervisor commands ct-650 command-line reference guide release 9.4 101 example use the following procedure to create a user pattern that transmits the pattern 00011010 twelve times, and store the pattern in the file mypattern . 1 type lup create mypattern . T...

  • Page 128

    Chapter 9 supervisor commands auxiliary supervisor commands 102 ct-650 command-line reference guide release 9.4 type the month (mm) from 01 to 12, day (dd) from 01 to 31, hours (hh) from 00 to 24, minutes (mm) from 00 to 59, and the year (yy) from 92 (1992) to 79 (2079). The year is optional. System...

  • Page 129

    A ct-650 command-line reference guide release 9.4 103 appendix a test results definitions this chapter describes the test results displayed by the ct-650. Topics discussed in this appendix are as follows: – “information results” on page 104 – “ds3 results” on page 121 – “ds1 results” on page 134 – “...

  • Page 130

    Appendix a test results definitions information results 104 ct-650 command-line reference guide release 9.4 information results the following sections describe the results appearing under various information commands. Alarms the following table lists the possible status codes for fan alarms: configu...

  • Page 131

    Appendix a test results definitions information results ct-650 command-line reference guide release 9.4 105 dcs the following fields appear after entering the information configure dcs command. Data bits number of data bits. Configured for use of a port. Possible values are as follows: – 1/0 dcs con...

  • Page 132

    Appendix a test results definitions information results 106 ct-650 command-line reference guide release 9.4 rtu the following fields appear after entering the information configure rtu command. Type type of dcs connected to the ct-650: 3/3,3/1, or 1/0. Model dcs model connected to the ct-650. Lang c...

  • Page 133

    Appendix a test results definitions information results ct-650 command-line reference guide release 9.4 107 test port port used for the test. N/a appears when an rtu port is idle. Framing or frm default framing mode for the idle condition when the rtu is not in use. Tx level transmitted signal level...

  • Page 134

    Appendix a test results definitions information results 108 ct-650 command-line reference guide release 9.4 status status of the rtu. Possible values are as follows: – inuse rtu a/b is in use and is not available for testing. – idle rtu a/b is idle and is available for testing. – avail rtu is not in...

  • Page 135

    Appendix a test results definitions information results ct-650 command-line reference guide release 9.4 109 defaults ds3 the following fields appear after entering the information configure defaults ds3 command. Field description error rate threshold error rate threshold for the logic error, bpv, an...

  • Page 136

    Appendix a test results definitions information results 110 ct-650 command-line reference guide release 9.4 defaults ds1/ft1 the following fields appear after entering the information configure defaults ds1/ft1 command. Log errors ds3 bit and frame errors are sent to the log file in real time. Field...

  • Page 137

    Appendix a test results definitions information results ct-650 command-line reference guide release 9.4 111 defaults ds0 the following fields appear after entering the information configure defaults ds0 command. Miscellaneous the following fields appear after entering the information configure misc....

  • Page 138

    Appendix a test results definitions information results 112 ct-650 command-line reference guide release 9.4 batch mode input com- mand delay number of seconds (0–200) used to control the pro- cessing rate of a batch file when it is executed. If 0, the ct-650 executes the batch file at the maximum sp...

  • Page 139

    Appendix a test results definitions information results ct-650 command-line reference guide release 9.4 113 security the following fields appear after entering the information configure security command. Ignore dial tone indicates if the ct-650 ignores a dial tone when attempting to dial. This optio...

  • Page 140

    Appendix a test results definitions information results 114 ct-650 command-line reference guide release 9.4 trunk_types the following fields appear after entering the information configure trunk_types command. User logoff flag indicating possibility of multiple sessions under a single user name. Ena...

  • Page 141

    Appendix a test results definitions information results ct-650 command-line reference guide release 9.4 115 answer_seq the following fields appear after entering the information configure answer_seq command. Dial_seq the following fields appear after entering the information configure dial_seq comma...

  • Page 142

    Appendix a test results definitions information results 116 ct-650 command-line reference guide release 9.4 crs the following cross-connect mapping appears after entering the information crs command. In the above illustration, the selected ds0 channel 1 is mapped within the dcs to connected channel ...

  • Page 143

    Appendix a test results definitions information results ct-650 command-line reference guide release 9.4 117 tests the following fields appear after entering the information tests command. Rtu status status of the rtu. Possible values are as follows: – inuse rtu a/b is in use and is not available for...

  • Page 144

    Appendix a test results definitions information results 118 ct-650 command-line reference guide release 9.4 talk/listen the following fields appear after entering the information talk/ listen command. Test type type of test that is in progress. Possible values are ds3 , ds1 , ft1 , d&i , or ds0 . Te...

  • Page 145

    Appendix a test results definitions information results ct-650 command-line reference guide release 9.4 119 last rx signal- ing bits last signaling bits received by the ct-650 dur- ing testing. Signal missing status indicating signal loss. Possible values are as follows: – y signal loss has occurred...

  • Page 146

    Appendix a test results definitions information results 120 ct-650 command-line reference guide release 9.4 taps the following fields appear after entering the information taps command. Tlk lis configuration of dtu for talk/listen. Possible values are as follows: – " " (blank status) dtu is not conf...

  • Page 147

    Appendix a test results definitions ds3 results ct-650 command-line reference guide release 9.4 121 ds3 results the following sections describe the fields appearing under various ds3 test results screens. Header the following fields appear in the header of the ds3 test results screens. Field descrip...

  • Page 148

    Appendix a test results definitions ds3 results 122 ct-650 command-line reference guide release 9.4 type status of the test. Possible values are aborted , com- plete , measure , and monitor . Side side of the cross-connect being tested. Possible val- ues are as follows: – con connected side of selec...

  • Page 149

    Appendix a test results definitions ds3 results ct-650 command-line reference guide release 9.4 123 rx frm type of framing detected by the receiver. If the detected framing does not match the selected framing, this field appears as white text on a black background. Possible framing formats include: ...

  • Page 150

    Appendix a test results definitions ds3 results 124 ct-650 command-line reference guide release 9.4 sync status status of the rtu receiver during detection and syn- chronization with the received signal. Possible values are as follows: – acquiring sync signal present, but waiting for frame synchroni...

  • Page 151

    Appendix a test results definitions ds3 results ct-650 command-line reference guide release 9.4 125 bipolar violations the following fields appear in the bpv (bipolar violations) category of the ds3 test results screens. Field description bpv errors number of bipolar violations detected since the be...

  • Page 152

    Appendix a test results definitions ds3 results 126 ct-650 command-line reference guide release 9.4 c-bit the following fields appear in the c-bit category of the ds3 test results screens. Field description c-bit par errors number of parity errors detected since initial ds3 c-bit frame synchronizati...

  • Page 153

    Appendix a test results definitions ds3 results ct-650 command-line reference guide release 9.4 127 frame the following fields appear in the frame category of the ds3 test results screens. Field description frame errors number of frame errors detected since initial frame synchronization. Frame err r...

  • Page 154

    Appendix a test results definitions ds3 results 128 ct-650 command-line reference guide release 9.4 logic the following fields appear in the logic category of the ds3 test results screens. Rx x-bits current status of the received x-bits when in a framed mode. The result is available after receiving ...

  • Page 155

    Appendix a test results definitions ds3 results ct-650 command-line reference guide release 9.4 129 line status the following fields appear in the line status category of the ds3 test results screens. Bit thr err sec number of seconds during which the pattern bit error rate exceeded or equaled the d...

  • Page 156

    Appendix a test results definitions ds3 results 130 ct-650 command-line reference guide release 9.4 pattern sync pattern synchronization detected. Signal loss hist at least one loss of signal was detected but no longer exists. Frame loss hist at least one loss of frame synchronization was detected b...

  • Page 157

    Appendix a test results definitions ds3 results ct-650 command-line reference guide release 9.4 131 parity the following fields appear in the parity category of the ds3 test results screens. Field description par errors number of parity errors detected since initial ds3 frame synchronization. Averag...

  • Page 158

    Appendix a test results definitions ds3 results 132 ct-650 command-line reference guide release 9.4 par err rate ratio of parity errors to (1) the number of bits over which parity was calculated (bit mode), or (2) the num- ber of ds3 m-frames received (block mode). The error rate is computed over th...

  • Page 159

    Appendix a test results definitions ds3 results ct-650 command-line reference guide release 9.4 133 signal the following fields appear in the signal category of the ds3 test results screens. Time the following fields appear in the time category of the ds3 test results screens. Field description sign...

  • Page 160

    Appendix a test results definitions ds1 results 134 ct-650 command-line reference guide release 9.4 ds1 results the following sections describe the fields appearing under various ds1 test results screens. Header the following fields appear in the header of the ds1 test results screens. Field descrip...

  • Page 161

    Appendix a test results definitions ds1 results ct-650 command-line reference guide release 9.4 135 type status of the test. Possible values are aborted , com- plete , measure , and monitor . Side side of the cross-connect being tested. Possible val- ues are as follows: – con connected side of selec...

  • Page 162

    Appendix a test results definitions ds1 results 136 ct-650 command-line reference guide release 9.4 rx frm type of framing detected by the receiver. If the detected framing does not match the selected framing, this field appears as white text on a black background. Possible framing formats include: ...

  • Page 163

    Appendix a test results definitions ds1 results ct-650 command-line reference guide release 9.4 137 sync status status of the rtu receiver during detection and syn- chronization with the received signal. Possible values are as follows: – acquiring sync signal present, but waiting for frame synchroni...

  • Page 164

    Appendix a test results definitions ds1 results 138 ct-650 command-line reference guide release 9.4 bipolar violations the following fields appear in the bpv (bipolar violations) category of the ds1 test results screens. Channel the channel category displays the status of signaling bits for the 24 c...

  • Page 165

    Appendix a test results definitions ds1 results ct-650 command-line reference guide release 9.4 139 frame the following fields appear in the frame category of the ds1 test results screens. Field description frame errors number of frame errors detected since initial frame synchronization. Frame err r...

  • Page 166

    Appendix a test results definitions ds1 results 140 ct-650 command-line reference guide release 9.4 g.821 the following fields appear in the g.821 category of the ds1 test results screens. Crc error rate ratio of crc errors to the number of superframes (24 t1 frames) received. Crc sev err sec number...

  • Page 167

    Appendix a test results definitions ds1 results ct-650 command-line reference guide release 9.4 141 line status the following fields appear in the line status category of the ds1 test results screens. % severely errored sec ratio, expressed as a percentage, of severely errored seconds (an error rate...

  • Page 168

    Appendix a test results definitions ds1 results 142 ct-650 command-line reference guide release 9.4 one’s den- sity alarm a signal was detected containing less than n ones in 8( n +1) bits, where n = 1…23. The prbs and lup pat- terns cause ones density alarms. Excess zeros alarm a t1 signal was dete...

  • Page 169

    Appendix a test results definitions ds1 results ct-650 command-line reference guide release 9.4 143 logic the following fields appear in the logic category of the ds1 test results screens. Field description bit errors number of received pattern bits that have a value opposite that of the correspondi...

  • Page 170

    Appendix a test results definitions ds1 results 144 ct-650 command-line reference guide release 9.4 signal the following fields appear in the signal category of the ds1 test results screens. Time the following fields appear in the time category of the ds1 test results screens. Field description sign...

  • Page 171

    Appendix a test results definitions ft1 results ct-650 command-line reference guide release 9.4 145 ft1 results the following sections describe the fields appearing under various ft1 test results screens. Header the following fields appear in the header of the ft1 test results screens. Test length l...

  • Page 172

    Appendix a test results definitions ft1 results 146 ct-650 command-line reference guide release 9.4 rtu test card rtu being used for the test. Appears in the form of _. Sys dcs or dsx transmitting the test signal. Tp port used for the test. N/a appears when an rtu port is idle. Type status of the te...

  • Page 173

    Appendix a test results definitions ft1 results ct-650 command-line reference guide release 9.4 147 tx pat pattern transmitted by the rtu. E. Time elapsed time since the test started. Rx frm type of framing detected by the receiver. If the detected framing does not match the selected framing, this f...

  • Page 174

    Appendix a test results definitions ft1 results 148 ct-650 command-line reference guide release 9.4 sync status status of the rtu receiver during detection and syn- chronization with the received signal. Possible values are as follows: – acquiring sync signal present, but waiting for frame synchroni...

  • Page 175

    Appendix a test results definitions ft1 results ct-650 command-line reference guide release 9.4 149 channel the following fields appear in the channel category of the ft1 test results screens. Field description last con- trol code last control code detected during testing. Control codes count runnin...

  • Page 176

    Appendix a test results definitions ft1 results 150 ct-650 command-line reference guide release 9.4 receive byte/code channel binary byte and signaling code status for a 56 kb channel. For 64 kb clear channel testing, the dis- played value has no meaning. These codes and bytes may appear on the scre...

  • Page 177

    Appendix a test results definitions ft1 results ct-650 command-line reference guide release 9.4 151 g.821 the following fields appear in the g.821 category of the ft1 test results screens. Field description error free sec number of seconds during which pattern synchroniza- tion is maintained through...

  • Page 178

    Appendix a test results definitions ft1 results 152 ct-650 command-line reference guide release 9.4 line status the following fields appear in the line status category of the ft1 test results screens. Consecu- tive sev err sec number of groups of three or more consecutive severely errored seconds in...

  • Page 179

    Appendix a test results definitions ft1 results ct-650 command-line reference guide release 9.4 153 logic the following fields appear in the logic category of the ft1 test results screens. Field description bit errors number of received pattern bits that have a value opposite that of the correspondi...

  • Page 180

    Appendix a test results definitions ds0 dds results 154 ct-650 command-line reference guide release 9.4 time the following fields appear in the time category of the ds0 dds test results screens. Ds0 dds results the following sections describe the fields appearing under various ds0 dds test results s...

  • Page 181

    Appendix a test results definitions ds0 dds results ct-650 command-line reference guide release 9.4 155 sig src signal source for the tested circuit. Possible values are as follows: – int or internal indicates the signal comes from the backplane from another card. – ext or external indicates the sig...

  • Page 182

    Appendix a test results definitions ds0 dds results 156 ct-650 command-line reference guide release 9.4 side side of the cross-connect being tested. Possible val- ues are as follows: – con connected side of selected digroup being tested from monitor command. – con/b connected side of digroup being t...

  • Page 183

    Appendix a test results definitions ds0 dds results ct-650 command-line reference guide release 9.4 157 sync status status of the rtu receiver during detection and syn- chronization with the received signal. Possible values are as follows: – acquiring sync signal present, but waiting for frame synch...

  • Page 184

    Appendix a test results definitions ds0 dds results 158 ct-650 command-line reference guide release 9.4 channel the following fields appear in the channel category of the ds0 dds test results screens. Field description last con- trol code last control code detected during testing. Control codes coun...

  • Page 185

    Appendix a test results definitions ds0 dds results ct-650 command-line reference guide release 9.4 159 receive byte/code channel binary byte and signaling code status for a 56 kb channel. For 64 kb clear channel testing, the dis- played value has no meaning. These codes and bytes may appear on the ...

  • Page 186

    Appendix a test results definitions ds0 dds results 160 ct-650 command-line reference guide release 9.4 g.821 the following fields appear in the g.821 category of the ds0 dds test results screens. Line status the following fields appear in the line status category of the ds0 dds test results screens...

  • Page 187

    Appendix a test results definitions ds0 dds results ct-650 command-line reference guide release 9.4 161 logic the following fields appear in the logic category of the ds0 dds test results screens. Signal loss hist at least one loss of signal was detected but no longer exists. Frame loss hist at leas...

  • Page 188

    Appendix a test results definitions ds0 dds results 162 ct-650 command-line reference guide release 9.4 time the following fields appear in the time category of the ds0 dds test results screens. Pattern loss sec- onds number of seconds during which pattern synchroniza- tion was lost since initial pa...

  • Page 189

    Appendix a test results definitions ds0 vf results ct-650 command-line reference guide release 9.4 163 ds0 vf results the following sections describe the fields appearing under various ds0 vf test results screens. Header the following fields appear in the header of the ds0 vf1 test results screens. ...

  • Page 190

    Appendix a test results definitions ds0 vf results 164 ct-650 command-line reference guide release 9.4 type status of the test. Possible values are aborted , com- plete , measure , and monitor . Side side of the cross-connect being tested. Possible val- ues are as follows: – con connected side of se...

  • Page 191

    Appendix a test results definitions ds0 vf results ct-650 command-line reference guide release 9.4 165 answer call the following fields appear after entering an answer_call command from the vf drop & insert test menu. Dial out the following fields appear after entering an dial_out command from the v...

  • Page 192

    Appendix a test results definitions ds0 vf results 166 ct-650 command-line reference guide release 9.4 terse the terse category of the vf test results screens lists the signaling events that occur during the test. Sequence of signaling events on vf circuits. Possible values include: – w - wink – d -...

  • Page 193

    Appendix a test results definitions ds0 vf results ct-650 command-line reference guide release 9.4 167 vf_di_measure the following fields appear after entering a vf_di_measure command from the vf drop & insert test menu. The fields that appear depend on the type of vf test you select. For a descript...

  • Page 194

    Appendix a test results definitions ds0 vf results 168 ct-650 command-line reference guide release 9.4 receive level level of the received signal during an echo return loss, insertion loss, par, three tone, or send-receive tone measure test, measured in dbm. Dc power level amount of dc power in the ...

  • Page 195

    Appendix a test results definitions supervisor results ct-650 command-line reference guide release 9.4 169 supervisor results the following section describes the fields available for the supervisor’s test command. System_test the following fields appear after entering the system_test command from th...

  • Page 196

    Appendix a test results definitions loopback status information 170 ct-650 command-line reference guide release 9.4 loopback status information when you type the loopback command, the ct-650 displays the loop- back status line (see figure 8 on page 10 ).The following fields appear in the loopback st...

  • Page 197

    Appendix a test results definitions loopback status information ct-650 command-line reference guide release 9.4 171 status loopback status per side as follows: in progress — loop code being transmitted. Sent — loop code transmitted, no confirmation is performed. Confirmed — loopback confirmed with t...

  • Page 198

    Appendix a test results definitions loopback status information 172 ct-650 command-line reference guide release 9.4.

  • Page 199

    B ct-650 command-line reference guide release 9.4 173 appendix b command parameter definitions this appendix describes command-line parameters for the ct-650. There are also explanations on how to format digroup numbers for various dcss, and how to specify feac alarm messages. Topics discussed in th...

  • Page 200

    Appendix b command parameter definitions parameter listing 174 ct-650 command-line reference guide release 9.4 parameter listing many ct-650 commands require parameters to properly execute. As you type commands, the ct-650 prompts you for the parameters, and displays the domain of accepted values. F...

  • Page 201

    Appendix b command parameter definitions parameter listing ct-650 command-line reference guide release 9.4 175 circuit_type one of the circuits the ct-650 can test: ds3 , ds1/ft1 , or ds0 . Command_digit digit associated with a previously entered command. Type ! To dis- play the digits associated wi...

  • Page 202

    Appendix b command parameter definitions parameter listing 176 ct-650 command-line reference guide release 9.4 directory one of the predefined directories for saving files. For the batch_command command, the possible values are private_directory (available only to the user) or common_directory (avai...

  • Page 203

    Appendix b command parameter definitions parameter listing ct-650 command-line reference guide release 9.4 177 fad_type indicates the fad type: single_fad or dual_fad . This parame- ter only appears when the specified dcs supports both single- and dual-fads. It also does not appear in the ds1 direct...

  • Page 204

    Appendix b command parameter definitions parameter listing 178 ct-650 command-line reference guide release 9.4 gain_hit_thres_2 sets second gain hit threshold from 2 to 10 db in 1 db steps. Default is 3 db. Gain_hit_thres_3 sets third gain hit threshold from 2 to 10 db in 1 db steps. Default is 6 db...

  • Page 205

    Appendix b command parameter definitions parameter listing ct-650 command-line reference guide release 9.4 179 loopback_type the type of loopback to perform. – dtmf_loopback for dual tone multifrequency digit type. Enter the digits to be sent to a loopable device. A maximum of 54 digits is possible....

  • Page 206

    Appendix b command parameter definitions parameter listing 180 ct-650 command-line reference guide release 9.4 phase_hit_thres sets phase hit threshold from 5 to 45 degrees in 5 degree steps. Default is 20 degrees. Phone_# , phone_number a string of up to 54 dtmf digits ( 0–9 , * , # , a–d ) to dial...

  • Page 207

    Appendix b command parameter definitions parameter listing ct-650 command-line reference guide release 9.4 181 seizure_type answer or dial using one of the following seizure types. For an explanation of vf channel seizure, see page 66 . – delay_dial a delay dial seizure sequence. The originating end...

  • Page 208

    Appendix b command parameter definitions parameter listing 182 ct-650 command-line reference guide release 9.4 signal_flow the signal flow used for splitting circuits the available values depend on the type of circuit and how it was split with the split_mode parameter. – test_code transmits a test c...

  • Page 209

    Appendix b command parameter definitions parameter listing ct-650 command-line reference guide release 9.4 183 split_mode type of split. The available values depend on the dcs configura- tion and circuit under test. Possible values are as follows: – a_split selects the a line of the selected digroup...

  • Page 210

    Appendix b command parameter definitions parameter listing 184 ct-650 command-line reference guide release 9.4 test_duration the duration for injecting errors. – burst injects a single burst of errors (bit or bpv) for the speci- fied duration and error rate defined by the last error_rate command. Th...

  • Page 211

    Appendix b command parameter definitions parameter listing ct-650 command-line reference guide release 9.4 185 test_type defines the type of test to perform when using a measure com- mand on a ds0 circuit. For vf circuits, possible values are as fol- lows: – freq_&_level measures received tone frequ...

  • Page 212

    Appendix b command parameter definitions parameter listing 186 ct-650 command-line reference guide release 9.4 transmit_level the transmit level, in db. Only applies to the following test types: attenuation distortion, echo return, impulse noise, intermodula- tion distance, line transient, par, phas...

  • Page 213

    Appendix b command parameter definitions specifying digroup numbers ct-650 command-line reference guide release 9.4 187 specifying digroup numbers the format for digroup numbers depends on the dcs and type of test you are performing. Table 9 lists some examples. For a detailed listing of digroup num...

  • Page 214

    Appendix b command parameter definitions feac alarm messages and loop codes 188 ct-650 command-line reference guide release 9.4 feac alarm messages and loop codes for ds3 testing with c-bit framing, you can specify the alarm message issued by the feac_alarm command (see page 43 ). Lucent dacs iv ds1...

  • Page 215

    Appendix b command parameter definitions feac alarm messages and loop codes ct-650 command-line reference guide release 9.4 189 table 11 lists the programmable alarm codes you can use with the feac_alarm command. Ds3_oof ds3 out-of-frame, loss of ds3 frame synchronization ds3_sa_eq_fl ds3 service af...

  • Page 216

    Appendix b command parameter definitions feac alarm messages and loop codes 190 ct-650 command-line reference guide release 9.4 101011 ds1 line - no. 11 010110 ds3_ais_rcvd 101100 ds1 line - no. 12 011010 ds3_idle_rcvd 101101 ds1 line - no. 13 001111 ds3_nsa_eq_fl 101110 ds1 line - no. 14 011101 com...

  • Page 217

    C ct-650 command-line reference guide release 9.4 191 appendix c test patterns and loop codes this appendix describes the available test patterns and loop codes provided in the ct-650 system. Topics discussed in this appendix are as follows: – “test patterns” on page 192 – “bridgetap/multipat patter...

  • Page 218

    Appendix c test patterns and loop codes test patterns 192 ct-650 command-line reference guide release 9.4 test patterns table 12 provides a list of ct-650 test patterns along with a descrip- tion of how they work. Unless otherwise indicated, these test patterns are transmitted from left to right in ...

  • Page 219

    Appendix c test patterns and loop codes test patterns ct-650 command-line reference guide release 9.4 193 x 2^20-1 1,048,575-bit pseudorandom pattern which generates a maxi- mum of 19 sequential zeros and 20 sequential ones. This pattern conforms to ccitt recommendation o.151. X x x 2^20-1- qrss 1,0...

  • Page 220

    Appendix c test patterns and loop codes test patterns 194 ct-650 command-line reference guide release 9.4 x x lup ibm80 a fixed 24-octet test pattern. Refer to table 16 on page 200 for specific test pattern sequence. X x lup min_max fixed 72-octet minimum/maximum density pattern used to stress repea...

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    Appendix c test patterns and loop codes test patterns ct-650 command-line reference guide release 9.4 195 x x lup t1_5 fixed 53-octet pattern. Used to stress t1 repeater equalization and albo circuitry. Pattern consists of rapid transitions from high ones density octets to low ones density octets. W...

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    Appendix c test patterns and loop codes test patterns 196 ct-650 command-line reference guide release 9.4 x x pat_sensit ive rdds3 single octet medium ones density test pattern which is used to simulate a typical signal transmitted over a dds circuit. Rdds3 is a continuous series of octets of 1100 0...

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    Appendix c test patterns and loop codes test patterns ct-650 command-line reference guide release 9.4 197 x x x prbs 63 63-bit pseudorandom pattern generates a maximum of 5 sequential zeros and 6 sequential ones. Used to test 56 kb/s cir- cuits with secondary channel to avoid the introduction of an ...

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    Appendix c test patterns and loop codes bridgetap/multipat patterns 198 ct-650 command-line reference guide release 9.4 bridgetap/multipat patterns table 13 and table 14 list the test patterns generated by the bridgetap and multipat test patterns. X userpat2 supervisor-programmable 3- to 24-bit test...

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    Appendix c test patterns and loop codes lup option test patterns ct-650 command-line reference guide release 9.4 199 lup option test patterns the following test patterns are only available when the lup option is installed. – ibm80 (see table 16 on page 200 ) – min_max (see table 17 on page 201 ) – t...

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    Appendix c test patterns and loop codes lup option test patterns 200 ct-650 command-line reference guide release 9.4 – t1_4 (see table 20 on page 203 ) – t1_5 (see table 21 on page 204 ) – t1_6 (see table 22 on page 205 ) – t1_daly (see table 23 on page 205 ) the following patterns are represented i...

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    Appendix c test patterns and loop codes lup option test patterns ct-650 command-line reference guide release 9.4 201 table 17 min_max test pattern sequence 01 02 03 04 05 06 07 08 09 80h 80h 80h 80h 01h 00h 01h 01h 01h 1000 0000 1000 0000 1000 0000 1000 0000 0000 0001 0000 0000 0000 0001 0000 0001 0...

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    Appendix c test patterns and loop codes lup option test patterns 202 ct-650 command-line reference guide release 9.4 ffh ffh ffh ffh ffh ffh ffh ffh ffh ffh 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 41 42 43 44 45 46 47 48 49 50 ffh ffh ffh f...

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    Appendix c test patterns and loop codes lup option test patterns ct-650 command-line reference guide release 9.4 203 1010 1010 0000 0001 0000 0001 0000 0001 0000 0001 0000 0001 0000 0001 1111 1111 1111 1111 1111 1111 41 42 43 44 45 46 47 48 49 50 ffh ffh ffh 80h 01h 80h 01h 80h 01h 80h 1111 1111 111...

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    Appendix c test patterns and loop codes lup option test patterns 204 ct-650 command-line reference guide release 9.4 10h 10h 10h 10h 10h 10h aah aah aah aah 0001 0000 0001 0000 0001 0000 0001 0000 0001 0000 0001 0000 1010 1010 1010 1010 1010 1010 1010 1010 101 102 103 104 105 106 107 108 109 110 10h...

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    Appendix c test patterns and loop codes lup option test patterns ct-650 command-line reference guide release 9.4 205 table 22 t1_6 test pattern sequence 01 02 03 04 05 06 07 08 09 10 01h 01h 01h 01h 01h 01h 00h 01h 01h 01h 0000 0001 0000 0001 0000 0001 0000 0001 0000 0001 0000 0001 0000 0000 0000 00...

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    Appendix c test patterns and loop codes loop codes 206 ct-650 command-line reference guide release 9.4 loop codes the following codes are available for looping ds1 circuits. 1010 1010 0000 0001 0000 0001 0000 0001 0000 0001 0000 0001 0000 0001 1111 1111 1111 1111 1111 1111 41 42 43 44 45 46 47 48 49...

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    Appendix c test patterns and loop codes loop codes ct-650 command-line reference guide release 9.4 207 esf-pay selects esf out-of-band payload loop codes. Transmits a loop-up code of 1111 1111 0010 1000 and a loop-down code of 1111 1111 0100 1100. R-htu selects in-band ds1 remote htu loop codes — 3 ...

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    Appendix c test patterns and loop codes loop codes 208 ct-650 command-line reference guide release 9.4 csu b selects ds0a latching customer service unit loop codes for specified channel. Include number of repeaters between the test head and csu/ repeater. This loopcode will loop csus and repeaters. ...

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    D ct-650 user’s guide release 9.3 209 appendix d customer services and support this appendix provides information about standard support services, add-on services, and training available through jdsu. Topics discussed in this appendix include: – “about our services” on page 210 – “standard support s...

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    Appendix d customer services and support about our services 210 ct-650 user’s guide release 9.3 about our services jdsu offers an unmatched and comprehensive portfolio of standard support services, add-on services, and training options to help customers successfully use purchased jdsu products. Serv...

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    Appendix d customer services and support add-on services ct-650 user’s guide release 9.3 211 for more information, including instructions for returning equipment for repair and/or calibration, go to: www.Jdsu.Com/en-us/test-and- measurement/support/repair-and-calibration/pages/default.Aspx . Technic...

  • Page 238

    Appendix d customer services and support add-on services 212 ct-650 user’s guide release 9.3 – extended product and systems support, including: – optional extended product warranties – optional extended repair services – calibration management services – around-the-clock technical assistance – a cer...

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    Appendix d customer services and support training options ct-650 user’s guide release 9.3 213 professional and consulting services for information about optional professional and consulting services available from jdsu, go to: www.Jdsu.Com/en-us/test-and-measurement/services/professional- and-consul...

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    Appendix d customer services and support training options 214 ct-650 user’s guide release 9.3.

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    Ct-650 command-line reference guide release 9.4 215 index symbols ! (history) command 37 a abbreviated entry of commands 12 abort command 37 account information 26 accounts command 84 alarm information 26 answer sequence settings 27 answer_call command 66 answer_seq command 98 auxiliary commands ! (...

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    Index 216 ct-650 command-line reference guide release 9.4 text_editor 35 trunk types 27 user_pattern 35 version 36 view_results 36 who 36 write 36 b backup_files command 85 batch files available commands 80 creating and running 80 unavailable commands 81 batch_command command 22 bridgetap test patte...

  • Page 243

    Index ct-650 command-line reference guide release 9.4 217 dial_seq command 98 disconnect command 38 ds0 dds test commands dds_di_measure 60 dds_di_split 60 dds_measure 60 dds_split 61 di_monitor 61 log_errors 64 mju 62 monitor 63 results 154 viewing defaults 111 ds0 test commands see ds0 dds test co...

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    Index 218 ct-650 command-line reference guide release 9.4 h hangup command 68 help command 26 hexadecimal-to-binary conversion table 200 i ibm80 test pattern sequence 200 information command syntax 26 – 28 test results 104 information screens 11 inject_errors command 28 k keyboard shortcuts 12 l lin...

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    Index ct-650 command-line reference guide release 9.4 219 alarm information 26 configuration 27 s screen_refresh command 33 screens command 8 confirmation 8 information 11 menus 6 results 9 supervisor 7 security settings 27 seizure sequences 66 select_test command 39 self_test command 33 serial port...

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    Index 220 ct-650 command-line reference guide release 9.4 u uf_split command ds1 50 ft1 56 user_pattern command 35 v version command 36 vf test commands, see ds0 vf test commands vf_di_measure command 71 vf_di_split command 76 vf_measure command 77 vf_split command 77 view_results command 36 w who c...

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    Test and measurement regional sales north america toll free: +1 800 638 2049 tel: +1 240 404 2999 fax:+1 240 404 2195 latin america tel: +1 954 688 5660 fax:+1 954 345 4668 asia pacific tel: +852 2892 0990 fax:+852 2892 0770 emea tel: +49 7121 86 2222 fax:+49 7121 86 1222 www.Jdsu.Com document infor...