Quantum Instruments Sensor Specification Sheet - page 3

Kaniusas, Eugenijus, Vienna University of Technology, Austria 

Katake, Anup, Texas A&M University, USA 

Kausel, Wilfried, University of Music, Vienna, Austria 

Kavasoglu, Nese, Mugla University, Turkey 

Ke, Cathy, Tyndall National Institute, Ireland 

Khan, Asif, Aligarh Muslim University, Aligarh, India 

Kim, Min Young, Koh Young Technology, Inc., Korea South 

Ko, Sang Choon, Electronics and Telecommunications Research Institute, 

Korea South 

Kockar, Hakan, Balikesir University, Turkey 

Kotulska, Malgorzata, Wroclaw University of Technology, Poland 

Kratz, Henrik, Uppsala University, Sweden 

Kumar, Arun, University of South Florida, USA 

Kumar, Subodh, National Physical Laboratory, India 

Kung, Chih-Hsien, Chang-Jung Christian University, Taiwan 

Lacnjevac, Caslav, University of Belgrade, Serbia 

Laurent, Francis, IMEC , Belgium 

Lay-Ekuakille, Aime, University of Lecce, Italy 

Lee, Jang Myung, Pusan National University, Korea South 

Li, Genxi, Nanjing University, China 

Li, Hui, Shanghai Jiaotong University, China 

Li, Xian-Fang, Central South University, China 

Liang, Yuanchang, University of Washington, USA 

Liawruangrath, Saisunee, Chiang Mai University, Thailand 

Liew, Kim Meow, City University of Hong Kong, Hong Kong 

Lin, Hermann, National Kaohsiung University, Taiwan 

Lin, Paul, Cleveland State University, USA 

Linderholm, Pontus, EPFL - Microsystems Laboratory, Switzerland 

Liu, Aihua, Michigan State University, USA 

Liu Changgeng, Louisiana State University, USA 

Liu, Cheng-Hsien, National Tsing Hua University, Taiwan 

Liu, Songqin, Southeast University, China 

Lodeiro, Carlos, Universidade NOVA de Lisboa, Portugal 

Lorenzo, Maria Encarnacio, Universidad Autonoma de Madrid, Spain 

Ma, Zhanfang, Northeast Normal University, China 

Majstorovic, Vidosav, University of Belgrade, Serbia 

Marquez, Alfredo, Centro de Investigacion en Materiales Avanzados, 

Mexico 

Matay, Ladislav, Slovak Academy of Sciences, Slovakia 

Mathur, Prafull, National Physical Laboratory, India 

Maurya, D.K., Institute of Materials Research and Engineering, Singapore 

Mekid, Samir, University of Manchester, UK 

Mendes, Paulo, University of Minho, Portugal 

Mennell, Julie, Northumbria University, UK 

Mi, Bin, Boston Scientific Corporation, USA 

Minas, Graca, University of Minho, Portugal 

Moghavvemi, Mahmoud, University of Malaya, Malaysia 

Mohammadi, Mohammad-Reza, University of Cambridge, UK 

Molina Flores, Esteban, Benemirita Universidad Autonoma de Puebla, 

Mexico 

Moradi, Majid, University of Kerman, Iran 

Morello, Rosario, DIMET, University "Mediterranea" of Reggio Calabria, 

Italy 

Mounir, Ben Ali, University of Sousse, Tunisia 

Mukhopadhyay, Subhas, Massey University, New Zealand 

Neelamegam, Periasamy, Sastra Deemed University, India 

Neshkova, Milka, Bulgarian Academy of Sciences, Bulgaria 

Oberhammer, Joachim, Royal Institute of Technology, Sweden 

Ould Lahoucin, University of Guelma, Algeria 

Pamidighanta, Sayanu, Bharat Electronics Limited (BEL), India 

Pan, Jisheng, Institute of Materials Research & Engineering, Singapore 

Park, Joon-Shik, Korea Electronics Technology Institute, Korea South 

Pereira, Jose Miguel, Instituto Politecnico de Setebal, Portugal 

Petsev, Dimiter, University of New Mexico, USA 

Pogacnik, Lea, University of Ljubljana, Slovenia 

Post, Michael, National Research Council, Canada 

Prance, Robert, University of Sussex, UK 

Prasad, Ambika, Gulbarga University, India 

Prateepasen, Asa, Kingmoungut's University of Technology, Thailand 

Pullini, Daniele, Centro Ricerche FIAT, Italy 

Pumera, Martin, National Institute for Materials Science, Japan 

Radhakrishnan, S. National Chemical Laboratory, Pune, India 

Rajanna, K., Indian Institute of Science, India 

Ramadan, Qasem, Institute of Microelectronics, Singapore 

Rao, Basuthkar, Tata Inst. of Fundamental Research, India 

Reig, Candid, University of Valencia, Spain 

Restivo, Maria Teresa, University of Porto, Portugal 

Rezazadeh, Ghader, Urmia University, Iran 

Robert, Michel, University Henri Poincare, France 

Rodriguez, Angel, Universidad Politecnica de Cataluna, Spain

Rothberg, Steve, Loughborough University, UK 

Royo, Santiago, Universitat Politecnica de Catalunya, Spain 

Sadana, Ajit, University of Mississippi, USA 

Sandacci, Serghei, Sensor Technology Ltd., UK 

Sapozhnikova, Ksenia, D.I.Mendeleyev Institute for Metrology, Russia 

Saxena, Vibha, Bhbha Atomic Research Centre, Mumbai, India 

Schneider, John K., Ultra-Scan Corporation, USA 

Seif, Selemani, Alabama A & M University, USA 

Seifter, Achim, Los Alamos National Laboratory, USA 

Shearwood, Christopher, Nanyang Technological University, Singapore 

Shin, Kyuho, Samsung Advanced Institute of Technology, Korea 

Shmaliy, Yuriy, Kharkiv National University of Radio Electronics, 

Ukraine 

Silva Girao, Pedro, Technical University of Lisbon Portugal 

Slomovitz, Daniel, UTE, Uruguay 

Smith, Martin, Open University, UK 

Soleymanpour, Ahmad, Damghan Basic Science University, Iran 

Somani, Prakash R., Centre for Materials for Electronics Technology, 

India 

Srinivas, Talabattula, Indian Institute of Science, Bangalore, India 

Srivastava, Arvind K., Northwestern University 

Stefan-van Staden, Raluca-Ioana, University of Pretoria, South Africa 

Sumriddetchka, Sarun, National Electronics and Computer Technology 

Center, Thailand

Sun, Chengliang, Polytechnic University, Hong-Kong 

Sun, Dongming, Jilin University, China 

Sun, Junhua, Beijing University of Aeronautics and Astronautics, China 

Sun, Zhiqiang, Central South University, China 

Suri, C. Raman, Institute of Microbial Technology, India 

Sysoev, Victor, Saratov State Technical University, Russia 

Szewczyk, Roman, Industrial Research Institute for Automation and 

Measurement, Poland 

Tan, Ooi Kiang, Nanyang Technological University, Singapore, 

Tang, Dianping, Southwest University, China 

Tang, Jaw-Luen, National Chung Cheng University, Taiwan 

Thumbavanam Pad, Kartik, Carnegie Mellon University, USA 

Tsiantos, Vassilios, Technological Educational Institute of Kaval, Greece 

Tsigara, Anna, National Hellenic Research Foundation, Greece 

Twomey, Karen, University College Cork, Ireland 

Valente, Antonio, University, Vila Real, - U.T.A.D., Portugal 

Vaseashta, Ashok, Marshall University, USA 

Vazques, Carmen, Carlos III University in Madrid, Spain 

Vieira, Manuela, Instituto Superior de Engenharia de Lisboa, Portugal 

Vigna, Benedetto, STMicroelectronics, Italy 

Vrba, Radimir, Brno University of Technology, Czech Republic 

Wandelt, Barbara, Technical University of Lodz, Poland 

Wang, Jiangping, Xi'an Shiyou University, China 

Wang, Kedong, Beihang University, China 

Wang, Liang, Advanced Micro Devices, USA 

Wang, Mi, University of Leeds, UK 

Wang, Shinn-Fwu, Ching Yun University, Taiwan 

Wang, Wei-Chih, University of Washington, USA 

Wang, Wensheng, University of Pennsylvania, USA 

Watson, Steven, Center for NanoSpace Technologies Inc., USA 

Weiping, Yan, Dalian University of Technology, China 

Wells, Stephen, Southern Company Services, USA 

Wolkenberg, Andrzej, Institute of Electron Technology, Poland 

Woods, R. Clive, Louisiana State University, USA 

Wu, DerHo, National Pingtung University of Science and Technology, 

Taiwan 

Wu, Zhaoyang, Hunan University, China 

Xiu Tao, Ge, Chuzhou University, China 

Xu, Tao, University of California, Irvine, USA 

Yang, Dongfang, National Research Council, Canada 

Yang, Wuqiang, The University of Manchester, UK 

Ymeti, Aurel, University of Twente, Netherland 

Yu, Haihu, Wuhan University of Technology, China 

Yufera Garcia, Alberto, Seville University, Spain 

Zagnoni, Michele, University of Southampton, UK 

Zeni, Luigi, Second University of Naples, Italy 

Zhong, Haoxiang, Henan Normal University, China 

Zhang, Minglong, Shanghai University, China 

Zhang, Qintao, University of California at Berkeley, USA 

Zhang, Weiping, Shanghai Jiao Tong University, China 

Zhang, Wenming, Shanghai Jiao Tong University, China 

Zhou, Zhi-Gang, Tsinghua University, China 

Zorzano, Luis, Universidad de La Rioja, Spain 

Zourob, Mohammed, University of Cambridge, UK 

Sensors & Transducers Journal (ISSN 1726-5479) is a peer review international journal published monthly online by International Frequency Sensor Association (IFSA). 

Available in electronic and CD-ROM. Copyright © 2007 by International Frequency Sensor Association. All rights reserved.