Keithley S530 Option manual - Safety

Other manuals for S530: User Manual, Manual, Administrative Manual
Manual is about: Parametric Test System, KTE Linear Parametric Test Library

Summary of S530

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    Www.Keithley.Com s530 parametric test system frequency analysis option manual s530-923-01 rev. A / january 2014 *ps53092301a* s530-923-01 a t ektr onix company a g re a t e r m e s u re o f co n fi d e n c e.

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    Frequency analysis option manual © 2014, keithley instruments, inc. Cleveland, ohio, u.S.A. All rights reserved. Any unauthorized reproduction, photocopy, or use of the information herein, in whole or in part, without the prior written approval of keithley instruments, inc. Is strictly prohibited. A...

  • Page 3: Safety

    Safety precautions the following safety precautions should be observed before using this product and any associated instrumentation. Although some instruments and accessories would normally be used with nonhazardous voltages, there are situations where hazardous conditions may be present. This produ...

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    For safety, instruments and accessories must be used in accordance with the operating instructions. If the instruments or accessories are used in a manner not specified in the operating instructions, the protection provided by the equipment may be impaired. Do not exceed the maximum signal levels of...

  • Page 5: Table Of Contents

    General information .................................................................................................. 1-1 introduction .......................................................................................................................... 1-1 package contents .......................

  • Page 6: Introduction

    In this section: introduction .............................................................................. 1-1 package contents ..................................................................... 1-1 prerequisites ............................................................................ 1-1 i...

  • Page 7: Software Description

    In this section: ring oscillator structures and measurement ............................ 2-1 software description ................................................................. 2-1 making a measurement ............................................................ 2-2 ring oscillator structures and...

  • Page 8: Making A Measurement

    Section 2: basic operations s530 parametric test systems frequency analysis option manual 2-2 s530-923-01 rev. A / january 2014 making a measurement measurements taken using the scope card require the following basic sequence of events: initialize, setup, and acquire. To take a measurement using the...

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    S530 parametric test systems frequency analysis option manual section 2: basic operations s530-923-01 rev. A / january 2014 2-3 create a kitt macro (s530) the following code creates a kitt macro (s530) that you can use to make a scope card measurement: double vcc = 5.0 conpin(smu1, vcc_pin, vccb_pin...

  • Page 10: Measurement Routines

    In this section: measurement routines ............................................................. 3-1 control routines ........................................................................ 3-7 measurement routines the measurement routines (ring oscillator measurement), are c-language commands t...

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    Section 3: software reference s530 parametric test systems frequency analysis option manual 3-2 s530-923-01 rev. A / january 2014 ring_lcc purpose: this algorithm detects frequencies of the top five amplitudes that are longer than a given level (default 0.5 mv)(see next figure). Otherwise, zero will...

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    S530 parametric test systems frequency analysis option manual section 3: software reference s530-923-01 rev. A / january 2014 3-3 figure 4: detected peaks sample ring_max purpose: this algorithm detects frequency at maximum amplitude. The next figure shows an example of a detected maximum amplitude....

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    Section 3: software reference s530 parametric test systems frequency analysis option manual 3-4 s530-923-01 rev. A / january 2014 figure 5: maximum signal detected sample ring_meas purpose: this test routine determines the ring oscillator frequency. The module sets the user defined noise level and p...

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    S530 parametric test systems frequency analysis option manual section 3: software reference s530-923-01 rev. A / january 2014 3-5 outputs type description freq double ring oscillator frequency, hz; 1e30 if fails level_freq double signal level, db; 1e30 if fails status double measure status 1: valid ...

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    Section 3: software reference s530 parametric test systems frequency analysis option manual 3-6 s530-923-01 rev. A / january 2014 ring_ref purpose: this algorithm detects the frequency that is closest to the specified reference, or target frequency (see next figure). The span of the scan will be fro...

  • Page 16: Control Routines

    S530 parametric test systems frequency analysis option manual section 3: software reference s530-923-01 rev. A / january 2014 3-7 control routines the provided control routines are c-language commands. Using the control routines provides lower- level (and more direct) control of the scope card compa...

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    Section 3: software reference s530 parametric test systems frequency analysis option manual 3-8 s530-923-01 rev. A / january 2014 freq_setup purpose: this command sets the start, stop, and step (scan resolution or res_bandwidth) frequencies of a scan. The recommended relationship of res_bandwidth fo...

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    S530 parametric test systems frequency analysis option manual section 3: software reference s530-923-01 rev. A / january 2014 3-9 freq_measure purpose: this routine measures frequency and amplitude of the strongest signal. Format: int freq_measure( double *freq_result, double *amp_result ); paramete...

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    Section 3: software reference s530 parametric test systems frequency analysis option manual 3-10 s530-923-01 rev. A / january 2014 freq_measure_next purpose: this routine returns the frequency and amplitude of the next highest peak in the frequency spectrum. Format: int freq_measure_next( double *fr...

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    S530 parametric test systems frequency analysis option manual section 3: software reference s530-923-01 rev. A / january 2014 3-11 freq_detect_peaks purpose: this command returns frequencies in signal amplitude order (see next figure). You get to choose the total number of peaks. If a given peak det...

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    Section 3: software reference s530 parametric test systems frequency analysis option manual 3-12 s530-923-01 rev. A / january 2014 format: int freq_detect_peaks(double min_level, double lower_bound, double upper_bound, double *freq_array, int npeaks, double *amp_array, int npeak1); parameters: min_l...

  • Page 22

    S530 parametric test systems frequency analysis option manual section 3: software reference s530-923-01 rev. A / january 2014 3-13 freq_close purpose: this routine disconnects communications to the scope card. Format: int freq_close(); parameters: none returns: this command returns a 1, if executed ...

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    Specifications are subject to change without notice. All keithley trademarks and trade names are the property of keithley instruments, inc. All other trademarks and trade names are the property of their respective companies. Keithley instruments, inc. Corporate headquarters ‡ 28775 aurora road ‡ cle...