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Keithley S530 User Manual

Other manuals for S530: Manual, Administrative Manual, Option manual
Manual is about: Parametric Test System, KTE Linear Parametric Test Library

Summary of S530

  • Page 1

    Www.Keithley.Com s530 parametric test system test subroutine library user’s manual s530-907-01 rev. A / september 2015 *ps53090701a* s530-907-01a a t ektr onix company a g re a t e r m e a s u re o f co n fi d e n c e.

  • Page 2: Test Subroutine Library

    Test subroutine library user's manual © 2015, keithley instruments cleveland, ohio, u.S.A. All rights reserved. Any unauthorized reproduction, photocopy, or use of the information herein, in whole or in part, without the prior written approval of keithley instruments is strictly prohibited. All keit...

  • Page 3: Safety Precautions

    Safety precautions the following safety precautions should be observed before using this product and any associated instrumentation. Although some instruments and accessories would normally be used with nonhazardous voltages, there are situations where hazardous conditions may be present. This produ...

  • Page 4

    For safety, instruments and accessories must be used in accordance with the operating instructions. If the instruments or accessories are used in a manner not specified in the operating instructions, the protection provided by the equipment may be impaired. Do not exceed the maximum signal levels of...

  • Page 5: Table Of Contents

    General information .................................................................................................. 1-1 introduction .......................................................................................................................... 1-1 manual contents ........................

  • Page 6

    Table of contents s530 parametric test system test subroutine library user's manual isubmx ..................................................................................................................................... 3-46 kdelay ..................................................................

  • Page 7: Introduction

    In this section: introduction .............................................................................. 1-1 manual contents ....................................................................... 1-1 contact information .................................................................. 1-1 intr...

  • Page 8

    In this section: how to use the library reference .............................................. 2-1 categorized subroutine lists ..................................................... 2-2 how to use the library reference the subroutines in the test subroutine library reference (on page 3-1) are in t...

  • Page 9: Categorized Subroutine Lists

    Section 2: using the test subroutine library s530 parametric test system test subroutine library user's manual 2-2 s530-907-01 rev. A / september 2015 details: additional information about using the subroutine. Figure 3: example details v/i polarities: the polarities of the current or voltage flow b...

  • Page 10

    S530 parametric test system test subroutine library user's manual section 2: using the test subroutine library s530-907-01 rev. A / september 2015 2-3 bipolar subroutines subroutine description link beta1 calculate dc at specified i e and v cb beta1 (on page 3-1) beta2 calculate dc and v be at speci...

  • Page 11

    Section 2: using the test subroutine library s530 parametric test system test subroutine library user's manual 2-4 s530-907-01 rev. A / september 2015 resistors, diodes, capacitors, and special structure subroutines subroutine description link bkdn measure breakdown voltage (force i, measure v) bkdn...

  • Page 12

    S530 parametric test system test subroutine library user's manual section 2: using the test subroutine library s530-907-01 rev. A / september 2015 2-5 fet and jfet subroutines subroutine description link gm estimate mesfet transconductance at v ds , v gs gm (on page 3-34) idss estimate mesfet i dss ...

  • Page 13: Subroutine Descriptions

    In this section: subroutine descriptions ............................................................ 3-1 subroutine descriptions beta1 this subroutine calculates the dc beta ( ) of a test device at constant emitter current (i e ) and collector-base bias (v cb ). The device is in the common-base con...

  • Page 14

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-2 s530-907-01 rev. A / september 2015 v/i polarities the polarities of v cb and i e are determined by device type. Source-measure units (smus) smu1: forces v cb , default current limit sm...

  • Page 15: Beta2

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-3 beta2 this subroutine calculates beta ( ) and base-emitter voltage (v be ) at a specified collector current (i c ) and collector-emitter bias (v ce )...

  • Page 16: Beta2A

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-4 s530-907-01 rev. A / september 2015 example result = beta2 (e, b, c, sub, ice, vce, &vbeout, &icout, type); schematic beta2a this subroutine calculates beta ( ) at collector-base voltag...

  • Page 17

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-5 details this subroutine is a revised version of the beta2 (on page 3-3) subroutine that uses the lptlib searchi and trig functions to search i e unti...

  • Page 18: Beta3A

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-6 s530-907-01 rev. A / september 2015 beta3a this subroutine calculates beta ( ) at collector-emitter voltage (v ce ) and collector-emitter current (i ce ) using the searchi and trig lptl...

  • Page 19

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-7 source-measure units (smus) smu1: forces v ce , maximum current limit, triggers on i ce smu2: searches i be , 3 v voltage limit smu3: forces v sub , ...

  • Page 20: Bice

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-8 s530-907-01 rev. A / september 2015 bice this subroutine sweeps the emitter-base voltage (v be ), measures the resulting collector-emitter current (i ce ), and calculates beta ( ) at ea...

  • Page 21: Bkdn

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-9 example result = bice(e, b, c, sub, vce, vbe1, vbe2, vsub, npts, ice_last, &beta_last, &beta_max, &ic_max); schematic bkdn this subroutine forces a c...

  • Page 22: Bvcbo

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-10 s530-907-01 rev. A / september 2015 example result = bkdn(hi, lo, sub, ipgm, vlim); schematic bvcbo this subroutine forces a collector current (i cbo ) and measures the collector-base ...

  • Page 23: Bvcbo1

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-11 example result = bvcbo(e, b, c, sub, ipgm, vlim, type); schematic bvcbo1 this subroutine uses the bsweepv lptlib function to measure collector-base ...

  • Page 24

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-12 s530-907-01 rev. A / september 2015 details this subroutine sweeps the collector-base voltage from vcbstart to vcbstop while monitoring the collector current with the emitter open. Whe...

  • Page 25: Bvceo

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-13 bvceo this subroutine measures the collector-emitter breakdown voltage (v ce ) when the collector current (i c ) is forced with the base terminal le...

  • Page 26: Bvceo2

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-14 s530-907-01 rev. A / september 2015 bvceo2 this subroutine measures collector-emitter breakdown voltage using the bsweepv lptlib function. Usage double bvceo2(int e, int b, int c, int ...

  • Page 27: Bvces

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-15 example result = bvceo2(e, b, c, sub, vcemin, vcemax, nstep, ipgm, udelay, type); schematic bvces this subroutine measures the collector-emitter/bas...

  • Page 28: Bvces1

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-16 s530-907-01 rev. A / september 2015 source-measure units (smus) smu1: forces i ces , programmed voltage limit, measures bvces example resu1t = bvces(e, b, c, sub, ipgm, vlim, type); sc...

  • Page 29: Bvdss

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-17 details this subroutine sweeps the collector-emitter voltage from vcemin to vcemax while monitoring the collector current with the base shorted to t...

  • Page 30

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-18 s530-907-01 rev. A / september 2015 details this subroutine measures the drain-to-source breakdown voltage of a field-effect transistor (fet) with the gate grounded with the source, at...

  • Page 31: Bvdss1

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-19 bvdss1 this subroutine measures the drain-source breakdown voltage using the bsweepv lptlib function. Usage double bvdss1 (int d, int g, int s, int ...

  • Page 32: Bvebo

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-20 s530-907-01 rev. A / september 2015 example result = bvdss1(d, g, s, sub, vdsmin, vdsmax, nstep, ipgm, udelay, type); schematic s bvebo this subroutine measures emitter-base breakdown ...

  • Page 33: Cap

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-21 source-measure units (smus) smu1: forces i ebo , programmed voltage limit, measures bvebo example result = bvebo(e, b, c, sub, ipgm, vlim, type); sc...

  • Page 34

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-22 s530-907-01 rev. A / september 2015 example result = cap(hi, lo, sub, vbias); schematic.

  • Page 35: Deltl1

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-23 deltl1 this subroutine estimates mosfet gate length reduction ( l) using transconductance (g m ) data obtained from the vtext2 subroutine for two di...

  • Page 36: Deltw1

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-24 s530-907-01 rev. A / september 2015 source-measure units (smus) see the vtext2 (on page 3-76) subroutine. Example result = deltl1(d1, g1, s1, sub1, l1, d2, g2, s2, sub2, l2, vlow, vhig...

  • Page 37

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-25 details w is calculated using the following equation: l = ((slope 2 / slope 1 ) w 1 - w 2 ) / (slope 2 /slope 1 - 1.0) the npts parameter must be gr...

  • Page 38

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-26 s530-907-01 rev. A / september 2015 details this subroutine estimates the forward early voltage of a bipolar device at constant ibe. The device is connected in the common-emitter confi...

  • Page 39: Fimv

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-27 fimv this subroutine forces a current and measures a voltage on a device with four high (source) pins and four ground pins. This is an alternate ver...

  • Page 40: Fnddat

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-28 s530-907-01 rev. A / september 2015 fnddat this subroutine searches an array and returns a new array. Usage void fnddat(double *x, int npts, double *y, int npts1, double x1, double x2,...

  • Page 41: Fndtrg

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-29 fndtrg this subroutine determines which native mode trigger to use. Usage int fndtrg(double low, double high) low input the low value high input the...

  • Page 42

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-30 s530-907-01 rev. A / september 2015 source-measure units (smus) smu1: forces voltage, default current limit, measures current example result = fvmi(h1, h2, h3, h4, l1, l2, l3, l4, v, &...

  • Page 43: Gamma1

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-31 gamma1 this subroutine returns the value of the body effect parameter gamma obtained from two measurements of the threshold voltage (v t ) at differ...

  • Page 44

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-32 s530-907-01 rev. A / september 2015 source-measure units (smus) see the vtext2 (on page 3-76) subroutine. Example result = gamma1(d, g, s, sub, vlow, vhigh, vds, vbs1, vbs2, phip, ithr...

  • Page 45

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-33 details this subroutine calculates the drain conductance (g d ) at drain-source voltage (v ds ), gate-source voltage (v gs ), and substrate bias vol...

  • Page 46

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-34 s530-907-01 rev. A / september 2015 gm this subroutine estimates transconductance of a metal-semiconductor field-effect transistor (mesfet) at a specified drain voltage (v ds ) and gat...

  • Page 47: Ibic1

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-35 example result = gm(d, g, s, sub, vds, idlim, vgs, vgstep, iglim, &iflag) schematic ibic1 this subroutine measures collector current (i ce ) and bas...

  • Page 48

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-36 s530-907-01 rev. A / september 2015 v/i polarities npn +v be , +v ce , and -v sub pnp -v be , -v ce , and -v sub source-measure units (smus) smu1: forces vce, maximum current limit, me...

  • Page 49: Icbo

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-37 icbo this subroutine measures leakage when the collector-base junction is reverse-biased (common base). Usage double icbo(int e, int b, int c, int s...

  • Page 50: Iceo

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-38 s530-907-01 rev. A / september 2015 example result = icbo(e, b, c, sub, vcbo, vsub) schematic iceo this subroutine measures collector-emitter leakage at collector voltage (v ce ) and s...

  • Page 51: Ices

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-39 example result = iceo(e, b, c, sub, vce, vsub) schematic ices this subroutine measures collector-emitter/base leakage when the collector-base juncti...

  • Page 52: Id1

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-40 s530-907-01 rev. A / september 2015 source-measure units (smus) smu1: forces vces, default current limit, measures ices smu2: forces vsub, default current limit example result = ices(e...

  • Page 53

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-41 v/i polarities n-channel +v ds , +v gs , -v bs p-channel -v ds , -v gs , +v bs source-measure units (smus) smu1: forces vds, default current limit, ...

  • Page 54: Idsat

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-42 s530-907-01 rev. A / september 2015 idsat this subroutine measures drain-source current (i ds ) at a specified drain-source voltage (v ds ) and substrate-source voltage (v bs ). The ga...

  • Page 55: Idss

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-43 idss this subroutine estimates the saturated drain current (i dss ) and saturation voltage (v dsat ) at forced drain voltage (v dss ) for a metal-se...

  • Page 56: Iebo

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-44 s530-907-01 rev. A / september 2015 example result = idss(d, g, s, sub, vdss, idlim, f, &idsat, &vdsat) schematic iebo this subroutine measures the reverse-bias leakage current through...

  • Page 57: Idvsvg

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-45 example result = iebo(e, b, c, s, vebo, vsub) schematic idvsvg this subroutine measures drain-source current (i ds ) when gate-source voltage (v gs ...

  • Page 58: Isubmx

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-46 s530-907-01 rev. A / september 2015 source-measure units (smus) smu1: forces vds, maximum current limit, measures ids smu2: sweeps v gs , maximum current limit sm3: forces vbs, default...

  • Page 59: Kdelay

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-47 details this subroutine measures the substrate current when the gate voltage (v gs ) is swept with v ds and v bs held constant. Maximum current meas...

  • Page 60: Leak

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-48 s530-907-01 rev. A / september 2015 details this subroutine provides an appropriate delay time for a current source to reach a specified voltage by using an equation that accounts for ...

  • Page 61: Logstp

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-49 example result = leak(hi, lo, sub, v, ilim) schematic logstp this subroutine creates an array using logarithmic steps. Usage int logstp(double xstar...

  • Page 62: Rcsat

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-50 s530-907-01 rev. A / september 2015 rcsat this subroutine estimates the collector resistance (r c ) modeling parameter when collector current (i c ) and base current (i b ) are swept a...

  • Page 63

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-51 make sure the collector current range selected is not near the bend in the i b -v ce curve (knee region of the curve). If operated within this regio...

  • Page 64

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-52 s530-907-01 rev. A / september 2015 example result = rcsat(e, b, c, sub, ice1, ice2, beta, vsub, npts, &r, &iflag) schematic.

  • Page 65

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-53 re this subroutine estimates emitter resistance (r e ). Usage double re(int e, int b, int c, int sub, double ib1, double ib2, double vsub, int npts,...

  • Page 66

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-54 s530-907-01 rev. A / september 2015 the i b versus v ce curve has a flyback region where v ce decreases as i b increases (the curve has a negative slope). The re subroutine drops all p...

  • Page 67: Res

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-55 res this subroutine calculates the resistance of a two-terminal resistor (force i, measure v). Usage double res(int hi, int lo, int sub, double ites...

  • Page 68: Res2

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-56 s530-907-01 rev. A / september 2015 res2 this subroutine measures two-terminal resistance with a voltage limit. Usage double res2(int hi, int lo, int sub, double itest, double vlim) hi...

  • Page 69: Res4

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-57 res4 this subroutine measures the resistance of a four-terminal resistor. Usage double res4(int his, int him, int los, int lom, int sub, double ites...

  • Page 70: Resv

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-58 s530-907-01 rev. A / september 2015 resv this subroutine measures two-terminal resistance (force v, measure i). Usage double resv(int hi, int lo, int sub, double v) hi input the hi pin...

  • Page 71: Rvdp

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-59 rvdp this subroutine makes a four-terminal van der pauw measurement. Usage double rvdp(int pin1, int pin2, int pin3, int pin4, int sub, double itest...

  • Page 72: Tdelay

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-60 s530-907-01 rev. A / september 2015 example result = rvdp(pin1, pin2, pin3, pin4, sub, itest, &ratio) schematic tdelay this subroutine calculates the delay time, in seconds, for the nu...

  • Page 73: Tox

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-61 tox this subroutine calculates the thickness of an oxide layer from the capacitance and the area of a metal-oxide semiconductor (mos) capacitor. Usa...

  • Page 74: Vbes

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-62 s530-907-01 rev. A / september 2015 vbes this subroutine measures base-emitter voltage of a bipolar transistor. Usage double vbes(int e, int b, int c, int sub, double ipgm, char type) ...

  • Page 75

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-63 example result = vbes(e, b, c, sub, ipgm, type) schematic vf this subroutine measures the forward biased junction voltage of a diode when a current ...

  • Page 76: Vg2

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-64 s530-907-01 rev. A / september 2015 example result = vf(hi, lo, sub, itest) schematic vg2 this subroutine measures gate-source voltage (v gs ) at a specified drain current (i ds ), dra...

  • Page 77

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-65 details drain voltage is forced and a binary search is done on v gs , starting with the two input values of v gs (vglo and vghi). The binary search ...

  • Page 78: Vgsat

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-66 s530-907-01 rev. A / september 2015 vgsat this subroutine measures saturated threshold voltage (v gsat ) of a field-effect transistor (fet) at a specified drain-source current (i ds )....

  • Page 79

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-67 example result = vgsat(d, g, s, sub, ipgm, vlim, vsub) schematic vp this subroutine estimates the voltage at which the current flow between the sour...

  • Page 80

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-68 s530-907-01 rev. A / september 2015 details this subroutine estimates the "pinch-off" voltage for a mesfet at a specified drain voltage and fraction of i dss . First, it measures i dss...

  • Page 81: Vp1

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-69 vp1 this subroutine estimates the voltage at which the current flow between the source and drain is blocked ("pinched-off") for a metal-semiconducto...

  • Page 82: Vt14

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-70 s530-907-01 rev. A / september 2015 example vp1(d, g, s, sub, ids, vdlim, vg1, vg2, iglim, &iflag, &vp) schematic vt14 this subroutine estimates the extrapolated threshold voltage (v t...

  • Page 83: Vtati

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-71 v/i polarities n-channel +v ds , +v g , -v bs , +i thr p-channel -v ds , -v g , +v bs , -i thr source-measure units (smus) see the vtati subroutine....

  • Page 84

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-72 s530-907-01 rev. A / september 2015 v/i polarities n-channel +v ds , +vlow, +vhigh, -v bs , +i thr p-channel -v ds , -vlow, -vhigh, +v bs , -i thr source-measure units (smus) smu1: for...

  • Page 85: Vtext

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-73 vtext this subroutine estimates the extrapolated gate-source threshold voltage of a metal-oxide field-effect transistor (mosfet). Usage double vtext...

  • Page 86

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-74 s530-907-01 rev. A / september 2015 the steps used by this technique to find the maximum slope or maximum g m (where v gs step size is a user-input variable): 1. From the last point be...

  • Page 87

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-75 example result = vtext(d, g, s, sub, type, vlow, vhigh, vds, vbs, ithr, vstep, nmax, &slope, &kflag) schematic.

  • Page 88: Vtext2

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-76 s530-907-01 rev. A / september 2015 vtext2 this subroutine estimates the extrapolated gate-source threshold voltage of a metal-oxide field-effect transistor (mosfet) using a modified v...

  • Page 89

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-77 the procedural differences are: a binary search on v gs is done to find i ds (vstart) calculate sweep limits: the vlow parameter = vstart the vhigh ...

  • Page 90: Vtext3

    Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-78 s530-907-01 rev. A / september 2015 vtext3 this subroutine estimates the extrapolated gate-source threshold voltage of a metal-oxide field-effect transistor (mosfet) using a condensed ...

  • Page 91

    S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-79 source-measure units (smus) see the idvsvg (on page 3-45) subroutine. Example vtext3(d, g, s, sub, vg1, vg2, vds, vbs, npts, &slope, &vt, &flag);.

  • Page 92: Index

    A arrays • 3-29, 3-51 b beta • 3-1, 3-3, 3-4, 3-6, 3-8 bipolar bipolar subroutines • 2-3, 3-8, 3-10, 3-11, 3-13, 3- 14, 3-16, 3-21, 3-36, 3-38, 3-39, 3-40, 3-52, 3- 55, 3-64 body effect • 3-32 breakdown voltage collector- base • 3-10, 3-11 collector- emitter • 3-13, 3-14, 3-16, 3-17 drain- source • ...

  • Page 93

    Specifications are subject to change without notice. All keithley trademarks and trade names are the property of keithley instruments. All other trademarks and trade names are the property of their respective companies. Keithley instruments corporate headquarters • 28775 aurora road • cleveland, ohi...