Www.Keithley.Com s530 parametric test system test subroutine library user’s manual s530-907-01 rev. A / september 2015 *ps53090701a* s530-907-01a a t ektr onix company a g re a t e r m e a s u re o f co n fi d e n c e.
Test subroutine library user's manual © 2015, keithley instruments cleveland, ohio, u.S.A. All rights reserved. Any unauthorized reproduction, photocopy, or use of the information herein, in whole or in part, without the prior written approval of keithley instruments is strictly prohibited. All keit...
Safety precautions the following safety precautions should be observed before using this product and any associated instrumentation. Although some instruments and accessories would normally be used with nonhazardous voltages, there are situations where hazardous conditions may be present. This produ...
For safety, instruments and accessories must be used in accordance with the operating instructions. If the instruments or accessories are used in a manner not specified in the operating instructions, the protection provided by the equipment may be impaired. Do not exceed the maximum signal levels of...
General information .................................................................................................. 1-1 introduction .......................................................................................................................... 1-1 manual contents ........................
Table of contents s530 parametric test system test subroutine library user's manual isubmx ..................................................................................................................................... 3-46 kdelay ..................................................................
In this section: introduction .............................................................................. 1-1 manual contents ....................................................................... 1-1 contact information .................................................................. 1-1 intr...
In this section: how to use the library reference .............................................. 2-1 categorized subroutine lists ..................................................... 2-2 how to use the library reference the subroutines in the test subroutine library reference (on page 3-1) are in t...
Section 2: using the test subroutine library s530 parametric test system test subroutine library user's manual 2-2 s530-907-01 rev. A / september 2015 details: additional information about using the subroutine. Figure 3: example details v/i polarities: the polarities of the current or voltage flow b...
S530 parametric test system test subroutine library user's manual section 2: using the test subroutine library s530-907-01 rev. A / september 2015 2-3 bipolar subroutines subroutine description link beta1 calculate dc at specified i e and v cb beta1 (on page 3-1) beta2 calculate dc and v be at speci...
Section 2: using the test subroutine library s530 parametric test system test subroutine library user's manual 2-4 s530-907-01 rev. A / september 2015 resistors, diodes, capacitors, and special structure subroutines subroutine description link bkdn measure breakdown voltage (force i, measure v) bkdn...
S530 parametric test system test subroutine library user's manual section 2: using the test subroutine library s530-907-01 rev. A / september 2015 2-5 fet and jfet subroutines subroutine description link gm estimate mesfet transconductance at v ds , v gs gm (on page 3-34) idss estimate mesfet i dss ...
In this section: subroutine descriptions ............................................................ 3-1 subroutine descriptions beta1 this subroutine calculates the dc beta ( ) of a test device at constant emitter current (i e ) and collector-base bias (v cb ). The device is in the common-base con...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-2 s530-907-01 rev. A / september 2015 v/i polarities the polarities of v cb and i e are determined by device type. Source-measure units (smus) smu1: forces v cb , default current limit sm...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-3 beta2 this subroutine calculates beta ( ) and base-emitter voltage (v be ) at a specified collector current (i c ) and collector-emitter bias (v ce )...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-4 s530-907-01 rev. A / september 2015 example result = beta2 (e, b, c, sub, ice, vce, &vbeout, &icout, type); schematic beta2a this subroutine calculates beta ( ) at collector-base voltag...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-5 details this subroutine is a revised version of the beta2 (on page 3-3) subroutine that uses the lptlib searchi and trig functions to search i e unti...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-6 s530-907-01 rev. A / september 2015 beta3a this subroutine calculates beta ( ) at collector-emitter voltage (v ce ) and collector-emitter current (i ce ) using the searchi and trig lptl...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-7 source-measure units (smus) smu1: forces v ce , maximum current limit, triggers on i ce smu2: searches i be , 3 v voltage limit smu3: forces v sub , ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-8 s530-907-01 rev. A / september 2015 bice this subroutine sweeps the emitter-base voltage (v be ), measures the resulting collector-emitter current (i ce ), and calculates beta ( ) at ea...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-9 example result = bice(e, b, c, sub, vce, vbe1, vbe2, vsub, npts, ice_last, &beta_last, &beta_max, &ic_max); schematic bkdn this subroutine forces a c...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-10 s530-907-01 rev. A / september 2015 example result = bkdn(hi, lo, sub, ipgm, vlim); schematic bvcbo this subroutine forces a collector current (i cbo ) and measures the collector-base ...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-11 example result = bvcbo(e, b, c, sub, ipgm, vlim, type); schematic bvcbo1 this subroutine uses the bsweepv lptlib function to measure collector-base ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-12 s530-907-01 rev. A / september 2015 details this subroutine sweeps the collector-base voltage from vcbstart to vcbstop while monitoring the collector current with the emitter open. Whe...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-13 bvceo this subroutine measures the collector-emitter breakdown voltage (v ce ) when the collector current (i c ) is forced with the base terminal le...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-14 s530-907-01 rev. A / september 2015 bvceo2 this subroutine measures collector-emitter breakdown voltage using the bsweepv lptlib function. Usage double bvceo2(int e, int b, int c, int ...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-15 example result = bvceo2(e, b, c, sub, vcemin, vcemax, nstep, ipgm, udelay, type); schematic bvces this subroutine measures the collector-emitter/bas...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-16 s530-907-01 rev. A / september 2015 source-measure units (smus) smu1: forces i ces , programmed voltage limit, measures bvces example resu1t = bvces(e, b, c, sub, ipgm, vlim, type); sc...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-17 details this subroutine sweeps the collector-emitter voltage from vcemin to vcemax while monitoring the collector current with the base shorted to t...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-18 s530-907-01 rev. A / september 2015 details this subroutine measures the drain-to-source breakdown voltage of a field-effect transistor (fet) with the gate grounded with the source, at...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-19 bvdss1 this subroutine measures the drain-source breakdown voltage using the bsweepv lptlib function. Usage double bvdss1 (int d, int g, int s, int ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-20 s530-907-01 rev. A / september 2015 example result = bvdss1(d, g, s, sub, vdsmin, vdsmax, nstep, ipgm, udelay, type); schematic s bvebo this subroutine measures emitter-base breakdown ...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-21 source-measure units (smus) smu1: forces i ebo , programmed voltage limit, measures bvebo example result = bvebo(e, b, c, sub, ipgm, vlim, type); sc...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-22 s530-907-01 rev. A / september 2015 example result = cap(hi, lo, sub, vbias); schematic.
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-23 deltl1 this subroutine estimates mosfet gate length reduction ( l) using transconductance (g m ) data obtained from the vtext2 subroutine for two di...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-24 s530-907-01 rev. A / september 2015 source-measure units (smus) see the vtext2 (on page 3-76) subroutine. Example result = deltl1(d1, g1, s1, sub1, l1, d2, g2, s2, sub2, l2, vlow, vhig...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-25 details w is calculated using the following equation: l = ((slope 2 / slope 1 ) w 1 - w 2 ) / (slope 2 /slope 1 - 1.0) the npts parameter must be gr...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-26 s530-907-01 rev. A / september 2015 details this subroutine estimates the forward early voltage of a bipolar device at constant ibe. The device is connected in the common-emitter confi...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-27 fimv this subroutine forces a current and measures a voltage on a device with four high (source) pins and four ground pins. This is an alternate ver...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-28 s530-907-01 rev. A / september 2015 fnddat this subroutine searches an array and returns a new array. Usage void fnddat(double *x, int npts, double *y, int npts1, double x1, double x2,...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-29 fndtrg this subroutine determines which native mode trigger to use. Usage int fndtrg(double low, double high) low input the low value high input the...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-30 s530-907-01 rev. A / september 2015 source-measure units (smus) smu1: forces voltage, default current limit, measures current example result = fvmi(h1, h2, h3, h4, l1, l2, l3, l4, v, &...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-31 gamma1 this subroutine returns the value of the body effect parameter gamma obtained from two measurements of the threshold voltage (v t ) at differ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-32 s530-907-01 rev. A / september 2015 source-measure units (smus) see the vtext2 (on page 3-76) subroutine. Example result = gamma1(d, g, s, sub, vlow, vhigh, vds, vbs1, vbs2, phip, ithr...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-33 details this subroutine calculates the drain conductance (g d ) at drain-source voltage (v ds ), gate-source voltage (v gs ), and substrate bias vol...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-34 s530-907-01 rev. A / september 2015 gm this subroutine estimates transconductance of a metal-semiconductor field-effect transistor (mesfet) at a specified drain voltage (v ds ) and gat...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-35 example result = gm(d, g, s, sub, vds, idlim, vgs, vgstep, iglim, &iflag) schematic ibic1 this subroutine measures collector current (i ce ) and bas...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-36 s530-907-01 rev. A / september 2015 v/i polarities npn +v be , +v ce , and -v sub pnp -v be , -v ce , and -v sub source-measure units (smus) smu1: forces vce, maximum current limit, me...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-37 icbo this subroutine measures leakage when the collector-base junction is reverse-biased (common base). Usage double icbo(int e, int b, int c, int s...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-38 s530-907-01 rev. A / september 2015 example result = icbo(e, b, c, sub, vcbo, vsub) schematic iceo this subroutine measures collector-emitter leakage at collector voltage (v ce ) and s...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-39 example result = iceo(e, b, c, sub, vce, vsub) schematic ices this subroutine measures collector-emitter/base leakage when the collector-base juncti...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-40 s530-907-01 rev. A / september 2015 source-measure units (smus) smu1: forces vces, default current limit, measures ices smu2: forces vsub, default current limit example result = ices(e...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-41 v/i polarities n-channel +v ds , +v gs , -v bs p-channel -v ds , -v gs , +v bs source-measure units (smus) smu1: forces vds, default current limit, ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-42 s530-907-01 rev. A / september 2015 idsat this subroutine measures drain-source current (i ds ) at a specified drain-source voltage (v ds ) and substrate-source voltage (v bs ). The ga...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-43 idss this subroutine estimates the saturated drain current (i dss ) and saturation voltage (v dsat ) at forced drain voltage (v dss ) for a metal-se...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-44 s530-907-01 rev. A / september 2015 example result = idss(d, g, s, sub, vdss, idlim, f, &idsat, &vdsat) schematic iebo this subroutine measures the reverse-bias leakage current through...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-45 example result = iebo(e, b, c, s, vebo, vsub) schematic idvsvg this subroutine measures drain-source current (i ds ) when gate-source voltage (v gs ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-46 s530-907-01 rev. A / september 2015 source-measure units (smus) smu1: forces vds, maximum current limit, measures ids smu2: sweeps v gs , maximum current limit sm3: forces vbs, default...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-47 details this subroutine measures the substrate current when the gate voltage (v gs ) is swept with v ds and v bs held constant. Maximum current meas...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-48 s530-907-01 rev. A / september 2015 details this subroutine provides an appropriate delay time for a current source to reach a specified voltage by using an equation that accounts for ...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-49 example result = leak(hi, lo, sub, v, ilim) schematic logstp this subroutine creates an array using logarithmic steps. Usage int logstp(double xstar...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-50 s530-907-01 rev. A / september 2015 rcsat this subroutine estimates the collector resistance (r c ) modeling parameter when collector current (i c ) and base current (i b ) are swept a...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-51 make sure the collector current range selected is not near the bend in the i b -v ce curve (knee region of the curve). If operated within this regio...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-52 s530-907-01 rev. A / september 2015 example result = rcsat(e, b, c, sub, ice1, ice2, beta, vsub, npts, &r, &iflag) schematic.
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-53 re this subroutine estimates emitter resistance (r e ). Usage double re(int e, int b, int c, int sub, double ib1, double ib2, double vsub, int npts,...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-54 s530-907-01 rev. A / september 2015 the i b versus v ce curve has a flyback region where v ce decreases as i b increases (the curve has a negative slope). The re subroutine drops all p...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-55 res this subroutine calculates the resistance of a two-terminal resistor (force i, measure v). Usage double res(int hi, int lo, int sub, double ites...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-56 s530-907-01 rev. A / september 2015 res2 this subroutine measures two-terminal resistance with a voltage limit. Usage double res2(int hi, int lo, int sub, double itest, double vlim) hi...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-57 res4 this subroutine measures the resistance of a four-terminal resistor. Usage double res4(int his, int him, int los, int lom, int sub, double ites...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-58 s530-907-01 rev. A / september 2015 resv this subroutine measures two-terminal resistance (force v, measure i). Usage double resv(int hi, int lo, int sub, double v) hi input the hi pin...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-59 rvdp this subroutine makes a four-terminal van der pauw measurement. Usage double rvdp(int pin1, int pin2, int pin3, int pin4, int sub, double itest...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-60 s530-907-01 rev. A / september 2015 example result = rvdp(pin1, pin2, pin3, pin4, sub, itest, &ratio) schematic tdelay this subroutine calculates the delay time, in seconds, for the nu...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-61 tox this subroutine calculates the thickness of an oxide layer from the capacitance and the area of a metal-oxide semiconductor (mos) capacitor. Usa...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-62 s530-907-01 rev. A / september 2015 vbes this subroutine measures base-emitter voltage of a bipolar transistor. Usage double vbes(int e, int b, int c, int sub, double ipgm, char type) ...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-63 example result = vbes(e, b, c, sub, ipgm, type) schematic vf this subroutine measures the forward biased junction voltage of a diode when a current ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-64 s530-907-01 rev. A / september 2015 example result = vf(hi, lo, sub, itest) schematic vg2 this subroutine measures gate-source voltage (v gs ) at a specified drain current (i ds ), dra...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-65 details drain voltage is forced and a binary search is done on v gs , starting with the two input values of v gs (vglo and vghi). The binary search ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-66 s530-907-01 rev. A / september 2015 vgsat this subroutine measures saturated threshold voltage (v gsat ) of a field-effect transistor (fet) at a specified drain-source current (i ds )....
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-67 example result = vgsat(d, g, s, sub, ipgm, vlim, vsub) schematic vp this subroutine estimates the voltage at which the current flow between the sour...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-68 s530-907-01 rev. A / september 2015 details this subroutine estimates the "pinch-off" voltage for a mesfet at a specified drain voltage and fraction of i dss . First, it measures i dss...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-69 vp1 this subroutine estimates the voltage at which the current flow between the source and drain is blocked ("pinched-off") for a metal-semiconducto...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-70 s530-907-01 rev. A / september 2015 example vp1(d, g, s, sub, ids, vdlim, vg1, vg2, iglim, &iflag, &vp) schematic vt14 this subroutine estimates the extrapolated threshold voltage (v t...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-71 v/i polarities n-channel +v ds , +v g , -v bs , +i thr p-channel -v ds , -v g , +v bs , -i thr source-measure units (smus) see the vtati subroutine....
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-72 s530-907-01 rev. A / september 2015 v/i polarities n-channel +v ds , +vlow, +vhigh, -v bs , +i thr p-channel -v ds , -vlow, -vhigh, +v bs , -i thr source-measure units (smus) smu1: for...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-73 vtext this subroutine estimates the extrapolated gate-source threshold voltage of a metal-oxide field-effect transistor (mosfet). Usage double vtext...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-74 s530-907-01 rev. A / september 2015 the steps used by this technique to find the maximum slope or maximum g m (where v gs step size is a user-input variable): 1. From the last point be...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-75 example result = vtext(d, g, s, sub, type, vlow, vhigh, vds, vbs, ithr, vstep, nmax, &slope, &kflag) schematic.
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-76 s530-907-01 rev. A / september 2015 vtext2 this subroutine estimates the extrapolated gate-source threshold voltage of a metal-oxide field-effect transistor (mosfet) using a modified v...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-77 the procedural differences are: a binary search on v gs is done to find i ds (vstart) calculate sweep limits: the vlow parameter = vstart the vhigh ...
Section 3: test subroutine library reference s530 parametric test system test subroutine library user's manual 3-78 s530-907-01 rev. A / september 2015 vtext3 this subroutine estimates the extrapolated gate-source threshold voltage of a metal-oxide field-effect transistor (mosfet) using a condensed ...
S530 parametric test system test subroutine library user's manual section 3: test subroutine library reference s530-907-01 rev. A / september 2015 3-79 source-measure units (smus) see the idvsvg (on page 3-45) subroutine. Example vtext3(d, g, s, sub, vg1, vg2, vds, vbs, npts, &slope, &vt, &flag);.
A arrays • 3-29, 3-51 b beta • 3-1, 3-3, 3-4, 3-6, 3-8 bipolar bipolar subroutines • 2-3, 3-8, 3-10, 3-11, 3-13, 3- 14, 3-16, 3-21, 3-36, 3-38, 3-39, 3-40, 3-52, 3- 55, 3-64 body effect • 3-32 breakdown voltage collector- base • 3-10, 3-11 collector- emitter • 3-13, 3-14, 3-16, 3-17 drain- source • ...
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