Wavecom GR64 Application Note - page 11
3
Type Approval
3.1 Electrical test cases
The electrical test cases are specified in §27.17 of the ETSI 3GPP TS 51010-1
specification. The attached link points to the 51010-1 specification archive within
ETSI.
http://www.3gpp.org/ftp/Specs/archive/51_series/51.010-1/
)
3.1.1 VCC
The SIM supply voltage is tested by the 27.17.2.1 e) test cases. If any of these test
cases fail it is most likely due to too high impedance in the trace, causing the high
voltage to go below minimum. This can be solved by adding a capacitor as close to
the SIM-holder as possible (see 2.2.1 above).
3.1.2 RST
The RST signal is tested by the 27.17.2.2 e) test cases. These should not fail.
3.1.3 CLK
The CLK signal is tested by the 27.17.2.3 e) test cases. These tests could fail due to
over and under shoot issues caused by trace inductance. This ringing can be limited
by adding a small serial resistance close to the Wireless CPU system connector (see
3.1.4 IO
The IO signal is tested by the 27.17.2.5 e) test cases. These tests could fail due to
high capacitance caused by trace capacitance. This can be solved by adding a pull-up
resistance to SIMVCC close to the SIM-holder (see 2.2.3 above).
GR/GS64 Application Note
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SIM Interface
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